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Refurbished Tecnai G2 F30 Scanning Transmission Electron Microscope (STEM)

Refurbished Tecnai G2 F30 Scanning Transmission Electron Microscope (STEM)

The Tecnai G2 F30 is a highly sophisticated 300 kV Field Emission (FEG) scanning transmission electron microscope (S/TEM) with a unsurpassed task oriented user interface.

It offers highly versatile performance, increased productivity with ease of use and in a personal environment and runs under Windows XP operating system.  This tool is currently being refurbished by TSS Microscopy.

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Key Features

  • Superior performance in 300KV FEG STEM imaging, nanoanalysis and TEM imaging
  • Simultaneous data recording by fully embedding STEM, CCD cameras, EDX detectors, EELS spectrometers and energy filters
  • Wide range of optional FEI application software solutions, e.g. S/TEM tomography package and TrueImage™ focal series reconstruction
  • Flexible high tension voltages
  • Robust routine analysis down to the sub-nanometer
  • Ultra-clean vacuum

Special Applications

  • Holography (Bi-Prism, and Gatan Holoworks)
  • Tecnai Free Lens Control
  • Lorentz
  • Tomography (FEI SW and Tomography Holder)
  • EFTEM EELS

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