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Remanufactured FEI Focused Ion Beam FIB200 - For Imaging and Milling

Remanufactured FEI Focused Ion Beam FIB200 - For Imaging and Milling

The FIB200 is a workhorse Focused Ion Beam (FIB) instrument capable of cross sectioning, imaging, TEM sample preparation and more.

The FIB200 has motorized XYZR travel with manual tilt.  The 50mm x 50mm XY stage can hold most typical samples and is used in the industry for FA, QA, R&D, product development and more. This tool is refurbished and ready for demonstration at TSS Microscopy.

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Key Features

  • Gallium LMIS FIB column with imaging capable to 7nm or better
  • Prelens and Magnum options available from TSS Microscopy
  • 50mm x 50mm XY stage fits most samples
  • XYZRT travel
  • Easy to use User Interface
  • CDM for electron and ion beam imaging
  • Optional: TEM section preparation and lift-out
  • TSS can custom configure the FIB200 for you

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