7500 Atomic Force Microscope (AFM) from Agilent

The new Agilent 7500 AFM/SPM displays excellent performance, versatility and ease-of-use for nanoscale characterization, measurement and manipulation.

Outstanding low-noise performance is achieved with the 90µm AFM closed-loop scanner enabling atomic-resolution imaging.

Key Features

The key features of the 7500 AFM are:

  • It offers excellent closed-loop resolution, environmental and temperature control, and a wide range of electrochemistry capabilities
  • The 7500 scanner’s standard nose cone supports an expanded set of imaging modes, including Agilent’s patented MAC Mode
  • It has easy-to-load nose cones for additional AFM techniques that can be interchanged quickly and conveniently
  • Using Mac Mode III, single-pass nanoscale electrical characterization is achievable

Key Applications

The 7500 AFM is used for the following applications:

  • Materials science
  • Life science
  • Polymer science
  • Electrochemistry
  • Electrical characterization 
  • Nanolithography applications
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