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Latest Equipment
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NT-MDT NTEGRA Prima Scanning Probe Microscope |
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NTEGRA Prima is capable of performing more than 40 measuring methods, what allows analyzing physical and chemical properties of the surface with high precision and resolution. It is possible to carry out experiments in air, as well as in liquids and in controlled environment. The new generation electronics provides operations in high-frequency (up to 5MHz) modes. This feature appears to be principal for the work with high-frequency AFM modes and using high-frequency cantilevers.
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Thermo Scientific Nicolet iS10 FT-IR Spectrometer |
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The new Thermo Scientific Nicolet™ iS™ 10 FT-IR spectrometer is perfect for QA/QC, perfect for the Chem Lab, and perfect for the Classroom. It excels at rugged, precise, fast-paced operation, yet simplifies laboratory data collection to its most basic: load the sample, generate the spectrum, and press Print. The instrument does all the work!
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Carbon Design Innovations Carbon Core High-Aspect Ratio (CCHAR) AFM Probe |
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The CCHAR high-aspect ratio CNT AFM probe, are designed for critical dimension measurements and imaging high-Z structures in materials science, metrology and life science applications. The standard CNT probe length is approximately 1µm overall with < 500nm of exposed CNT tip. These two dimensions can also be custom engineered to user specifications.
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RPM2000 Rapid Photoluminescence Mapper from Nanometrics and LOT Oriel |
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The RPM2000 Rapid Photoluminescence Mapper is a fast, room temperature photoluminescence (PL) mapping system suitable for use in R&D, production and quality control environments. The RPM2000 has been designed specifically to obtain whole wafer PL maps in a mere fraction of the time previously associated with this sort of measurement, giving the ability to measure and assess wafers between production runs.
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CSM Instruments Ultra Nanoindentation (UNHT) |
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CSM Instruments has introduced a brand new nano range high resolution nanoindenter containing ultra low thermal drift. When used per ISO 14577 test methods the Ultra Nano Hardness Tester is able to measure the most accurate data of any other instruments on the market.
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FEI Phenom Scanning Electron and Optical Microscope |
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At FEI, we have consistently helped organizations break new ground by providing the highest resolution imaging and analytical tools. Now we are proud to introduce Phenom: a unique imaging tool that brings a new dimension to microscopy. Never before could you get this level of image quality, resolution and sample throughput at such a low price point. Phenom makes high-end imaging practical and affordable for all.
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AIST-NT SmartSPM 1000 Atomic Force Microscope |
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AIST-NT Inc. has developed a new, fully motorized AFM which allows to perfectly align a cantilever, laser and photodiode by just one click on a command button. The scanning settings and landing parameters are also automated that allows to avoid any time consuming adjustment operations, thus leaving more time to researcher for designing the experiment and performing more accurate measurements.
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CSM Instruments Nano Tribometer (NTR) |
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The CSM Nano Tribometer is a unique instrument since its low load range down to 50µN. This instrument can perform both the linear reciprocating and rotating mode. One outstanding feature of all the CSM Tribometers is that the experiment stops automatically when the coefficient of friction reaches a threshold value or when a specified number of turns are reached.
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IG-1000 Particle Size Analyzer from Shimadzu Scientific Instruments |
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The IG-1000 incorporates a new particle size measurement principle called Induced Grating (IG), which allows users to measure nanoparticles with high sensitivity and reproducibility. The IG method does not use scattered light, is free from physical restrictions and does not require the input of the refractive index as a measurement condition.
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PANalytical Axios FAST X-Ray Fluorescence Spectrometer |
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The fastest XRF spectrometer on the market. When there is a need for speed, the Axios-FAST simultaneous XRF spectrometer is the ideal solution. Axios FAST allows simultaneous fixed-channel measurements of up to 28 elements, giving extremely rapid routine analysis for real-time process control.
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AIST-NT OmegaScope 1000 Scanning Probe Microscope |
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AIST-NT's OmegaScope™ 1000 AFM has been designed to be easily integrated with optical instruments such as Raman spectrometers, UV-VIS adsorption spectrometers etc. Open design of the AFM head makes it possible to have the high quality optical access from the top (100X, 0.70 NA), side (20X, 0.42 NA) or bottom (using any commercially available objective, including immersion objectives).
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Beneq TFS 500 Atomic Layer Deposition System |
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Beneq Thin Film System TFS 500 ALD reactor is designed for thin film processing, protective coating, functional surface buildup and doping purposes. Substrate alternatives include wafers and other planar substrates, powders and porous substrates and complex 3D substrates. Beneq TFS 500 can be equipped with a manual load lock for rapid wafer processing.
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FEI Fibermetric Fiber Analysis System |
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Now, direct observation and measurement of micro and nano fibers is faster, better and easier than ever before. With the Fibermetric™ system powered by Phenom you can load and image samples in about 30 seconds. Magnifications up to 24,000 times produce accurate information on a large range of fibers as small as 100nm in diameter.
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VEECO BioScope Catalyst Atomic Force Microscope |
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The BioScope Catalyst Atomic Force Microscope (AFM) has been designed from top to bottom to make it easier than ever to realize the unique benefits of combining atomic force microscopy and light microscopy. The system represents a new generation of life science AFM, designed to meet the advanced application needs of today and tomorrow.
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Hiden Analytical SIMS Workstation with MAXIM Analyser |
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The Hiden SIMS Workstation has been developed with strong interaction with those used to performing SIMS analyses for both contract service work and research in many fields of analysis. The philosophy of design has been simple, to produce a proper SIMS analysis instrument which combines high sensitivity, flexibility and ease of operation, but also to make it cost effective both in terms of capital and ongoing costs.
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Micronit Fluidic Connect Microfluidic Connection Platform |
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Fluidic Connect is an affordable microfluidic connection platform enabling user-friendly interconnections between the microfluidic chip and peripheral equipment. Fluidic Connect facilitates to create your own lab-on-a-chip set-up. The unique design of the chip holder enables to work safely under high pressure (up to 100 bar / 1450 psi) with a very low (near-zero) dead volume. The material used is chemically inert and mechanically robust.
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Nanosurf easyScan 2 FlexAFM |
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Nanosurf extends its easyScan 2 product line with the FlexAFM. With its electromagnetically actuated, flexure-based XY-scanner technology combined with a piezo-based Z-scanner, the FlexAFM offers highly linear, ultra-flat, and fast scanning performance, while at
the same time providing Lateral Force and liquid measurement capabilities to its users.
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ECV Pro Electrochemical Capacitance Voltage Profiler from Nanometrics and LOT Oriel |
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The ECV Pro is the result of a total redesign that completely redefines ECV profiling. We have taken 25 years of profiling experience and coupled it with 25 years of advances in instrument control technology to produce the most precise, most reproducible, most highly-automated CV profiler ever.
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