AZONANO - The A to Z of Materials


Bruker AFM and SPMs for nanotechnology
Park Systems - Manufacturer of a complete range of AFM solutions
SkySpring Nanomaterials offers nanoparticles, nanopowders, micron powders and CNTs
NanoTest™, the complete nanomechanical testing center

Product Showcase



Select from the links below to navigate through to each equipment category.

AFM Tips, Probes, Cantilevers
Atomic Emission Spectrometers
Atomic Force Microscopes (AFM)
Atomic Layer Deposition (ALD) Systems
Biomedical Atomic Force Microscopes (bio-AFM)
Calorimeters
Carrier Concentration Profiler
Cryogenic Probe Stations
Focused Ion Beam (FIB) Systems
Induction Heating
Light Scattering Instruments
Micro Hardness Testers
Microfluidic Devices
Micropositioning Systems
Moisture Analyzers
Nanoimprint Lithography Templates
Nanoindentation Testers
Nanolithography Systems
Nanoparticle Characterization Systems
Nanoparticle Synthesizers
Nanopositioning Systems
Optical Characterization Systems
Optical Tweezers
Particle Size Analyzers
Photoluminescence Mapper
Piezo Actuators
Profilometers
Scanning Electron Microscopes (SEM)
Scanning Near-Field Optical Microscopes (SNOM)
Scanning Probe Microscopes (SPM)
Scratch Testers
Spectrofluorometers
Spectrometers
Spectrophotometers
Spectroscopic Ellipsometers
Sputtering Systems
Surface Area Analyzers
Thermal Analysis Equipment
Thin-Film Deposition Systems
Transmission Electron Microscopes
Tribometers - Friction and Wear Testers
Wafer Bonders
X-Ray Diffractometers
X-Ray Fluorescence Analyzers
 


Latest Equipment

 

Carbon Design Innovations Carbon Core High-Aspect Ratio (CCHAR) AFM Probe


Carbon Design Innovations Carbon Core High-Aspect Ratio (CCHAR) AFM Probe

The CCHAR high-aspect ratio CNT AFM probe, are designed for critical dimension measurements and imaging high-Z structures in materials science, metrology and life science applications. The standard CNT probe length is approximately 1µm overall with < 500nm of exposed CNT tip. These two dimensions can also be custom engineered to user specifications.

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Beneq TFS 500 Atomic Layer Deposition System


Beneq TFS 500 Atomic Layer Deposition System

The TFS 500 is an ALD system designed for use in thin film coating applications. The unit incorporates leading edge design and technical solutions that enable superior quality coatings and results. In Beneq, we have approached ALD tool design with an open mind and innovative spirit. Our goal is to develop new applications and business opportunities by combining experience with invention. The TFS 500, our initial reactor model, has proven its case as a versatile tool adaptable to both in-depth thin film research and robust batch processing.

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VEECO BioScope Catalyst Atomic Force Microscope


VEECO BioScope Catalyst Atomic Force Microscope

The BioScope Catalyst Atomic Force Microscope (AFM) has been designed from top to bottom to make it easier than ever to realize the unique benefits of combining atomic force microscopy and light microscopy. The system represents a new generation of life science AFM, designed to meet the advanced application needs of today and tomorrow.

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AIST-NT OmegaScope 1000 Scanning Probe Microscope


AIST-NT OmegaScope 1000 Scanning Probe Microscope

AIST-NT's OmegaScope™ 1000 AFM has been designed to be easily integrated with optical instruments such as Raman spectrometers, UV-VIS adsorption spectrometers etc. Open design of the AFM head makes it possible to have the high quality optical access from the top (100X, 0.70 NA), side (20X, 0.42 NA) or bottom (using any commercially available objective, including immersion objectives).

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Micronit Fluidic Connect Microfluidic Connection Platform


Micronit Fluidic Connect Microfluidic Connection Platform

Fluidic Connect is an affordable microfluidic connection platform enabling user-friendly interconnections between the microfluidic chip and peripheral equipment. Fluidic Connect facilitates to create your own lab-on-a-chip set-up. The unique design of the chip holder enables to work safely under high pressure (up to 100 bar / 1450 psi) with a very low (near-zero) dead volume. The material used is chemically inert and mechanically robust.

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IG-1000 Particle Size Analyzer from Shimadzu Scientific Instruments


IG-1000 Particle Size Analyzer from Shimadzu Scientific Instruments

The IG-1000 incorporates a new particle size measurement principle called Induced Grating (IG), which allows users to measure nanoparticles with high sensitivity and reproducibility. The IG method does not use scattered light, is free from physical restrictions and does not require the input of the refractive index as a measurement condition.

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PANalytical Axios FAST X-Ray Fluorescence Spectrometer


PANalytical Axios FAST X-Ray Fluorescence Spectrometer

The fastest XRF spectrometer on the market. When there is a need for speed, the Axios-FAST simultaneous XRF spectrometer is the ideal solution. Axios FAST allows simultaneous fixed-channel measurements of up to 28 elements, giving extremely rapid routine analysis for real-time process control.

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Phenom-World Fibermetric Fiber Analysis System


Phenom-World Fibermetric Fiber Analysis System

Now, direct observation and measurement of micro and nano fibers is faster, better and easier than ever before. With the Fibermetric system powered by Phenom you can load and image samples in about 30 seconds. Magnifications up to 24,000 times produce accurate information on a large range of fibers as small as 100nm in diameter.

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NT-MDT NTEGRA Prima Scanning Probe Microscope


NT-MDT NTEGRA Prima Scanning Probe Microscope

NTEGRA Prima is capable of performing more than 40 measuring methods, what allows analyzing physical and chemical properties of the surface with high precision and resolution. It is possible to carry out experiments in air, as well as in liquids and in controlled environment. The new generation electronics provides operations in high-frequency (up to 5MHz) modes. This feature appears to be principal for the work with high-frequency AFM modes and using high-frequency cantilevers.

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Phenom Scanning Electron and Optical Microscope from Phenom-World


Phenom Scanning Electron and Optical Microscope from Phenom-World

The Phenom takes you through your world in seconds - from millimeters to the sub-micron scale, while its award winning user interface makes it easy to operate for everyone. The Phenom will do for microscopy what personal computers did for office efficiency. The superb image quality of the Phenom will help create new ways to ramp up production and reduce the time required for root cause analysis.

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Nanosurf easyScan 2 FlexAFM


Nanosurf easyScan 2 FlexAFM

Nanosurf extends its easyScan 2 product line with the FlexAFM. With its electromagnetically actuated, flexure-based XY-scanner technology combined with a piezo-based Z-scanner, the FlexAFM offers highly linear, ultra-flat, and fast scanning performance, while at the same time providing Lateral Force and liquid measurement capabilities to its users.

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CSM Instruments Nano Tribometer (NTR)


CSM Instruments Nano Tribometer (NTR)

The CSM Nano Tribometer is a unique instrument since its low load range down to 50µN. This instrument can perform both the linear reciprocating and rotating mode. One outstanding feature of all the CSM Tribometers is that the experiment stops automatically when the coefficient of friction reaches a threshold value or when a specified number of turns are reached.

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Thermo Scientific Nicolet iS10 FT-IR Spectrometer


Thermo Scientific Nicolet iS10 FT-IR Spectrometer

The new Thermo Scientific Nicolet™ iS™ 10 FT-IR spectrometer is perfect for QA/QC, perfect for the Chem Lab, and perfect for the Classroom. It excels at rugged, precise, fast-paced operation, yet simplifies laboratory data collection to its most basic: load the sample, generate the spectrum, and press Print. The instrument does all the work!

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Hiden Analytical SIMS Workstation with MAXIM Analyser


Hiden Analytical SIMS Workstation with MAXIM Analyser

The Hiden SIMS Workstation has been developed with strong interaction with those used to performing SIMS analyses for both contract service work and research in many fields of analysis. The philosophy of design has been simple, to produce a proper SIMS analysis instrument which combines high sensitivity, flexibility and ease of operation, but also to make it cost effective both in terms of capital and ongoing costs.

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CSM Instruments Ultra Nanoindentation (UNHT)


CSM Instruments Ultra Nanoindentation (UNHT)

CSM Instruments has introduced a brand new nano range high resolution nanoindenter containing ultra low thermal drift. When used per ISO 14577 test methods the Ultra Nano Hardness Tester is able to measure the most accurate data of any other instruments on the market.

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AIST-NT SmartSPM 1000 Atomic Force Microscope


AIST-NT SmartSPM 1000 Atomic Force Microscope

AIST-NT Inc. has developed a new, fully motorized AFM which allows to perfectly align a cantilever, laser and photodiode by just one click on a command button. The scanning settings and landing parameters are also automated that allows to avoid any time consuming adjustment operations, thus leaving more time to researcher for designing the experiment and performing more accurate measurements.

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Nanotech 2010 - World's largest nanotech conference and expo
LakeShore cryogenic probe stations
Nanograde - Large stock of customized nanoparticles
Malverm Morphjologi G3 particle characterization system

 
SkySpring Nanomaterials offers nanoparticles, nanopowders, micron powders and CNTs
SkySpring Nanomaterials offers nanoparticles, nanopowders, micron powders and CNTs

AZoNano is grateful for the support provided by our sponsors to both AZoNano.com and to the authors
and peer reviewers of AZoJono -Journal of Nantechnology Online - open access to leading Nanotech Science.

 

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