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Building Blocks for Creation of Nano-Knots

Building Blocks for Creation of Nano-Knots

As sailors and mountaineers know very well, every knot carries out a specific function. There's a knot that slides, one that "floats", and one that comes undone with a single pull. In the field of nanotechnology as well, it is useful to have several kinds of molecular knots to be used, for instance, as mechanically resistant nano-cages for delivering chemical compounds or for confining and controlling toxic reagents. [More]
High Speed Desktop SEM for Large Samples: Phenom World Launches the Phenom XL at Pittcon 2015

High Speed Desktop SEM for Large Samples: Phenom World Launches the Phenom XL at Pittcon 2015

Phenom-World is proud to announce the Phenom XL, an addition to the highly successful Phenom desktop SEM product family. The Phenom XL is the world’s first desktop Scanning Electron Microscope (SEM) that allows full imaging of samples up to 100 mm x 100 mm. [More]
Seminar Series Shares Progress at MIT.nano

Seminar Series Shares Progress at MIT.nano

MIT.nano is the most ambitious and disruptive construction project in the modern history of MIT. “It won’t be sneaking under anyone’s radar,” says Arne Abramson, MIT’s director of capital projects. So Abramson and his colleagues from MIT Facilities have planned a series of lunchtime talks to give members of the MIT community a window on the details of the construction process. “Because MIT.nano is changing everyone’s patterns drastically in some way or another, we thought it would be a good opportunity to discuss exactly what we’re doing and why we’re doing it,” he says. [More]
Lasers Coupled with Force Sensors to Measure Forces Inside Materials such as Sand

Lasers Coupled with Force Sensors to Measure Forces Inside Materials such as Sand

Pick up a handful of sand, and it flows through your fingers like a liquid. But when you walk on the beach, the sand supports your weight like a solid. What happens to the forces between the jumbled sand grains when you step on them to keep you from sinking? [More]
Research into Soluble Carbon Nanotubes Supported by Malvern Zetasizer Nano

Research into Soluble Carbon Nanotubes Supported by Malvern Zetasizer Nano

New research from the University of Padova in Italy shows how the Zetasizer Nano S, a nanomaterial and molecular characterization system from Malvern Instruments, is supporting the development of soluble carbon nanotubes (CNTs). [More]
Atomic-Level Analysis of Aragonite Formation

Atomic-Level Analysis of Aragonite Formation

For almost a century, scientists have been puzzled by a process that is crucial to much of the life in Earth’s oceans: Why does calcium carbonate, the tough material of seashells and corals, sometimes take the form of calcite, and at other times form a chemically identical form of the mineral, called aragonite, that is more soluble — and therefore more vulnerable to ocean acidification? [More]
Femtosecond Time-Resolved X-ray Liquidography Helps Observe Real-Time Bond Formation in Chemical Reactions

Femtosecond Time-Resolved X-ray Liquidography Helps Observe Real-Time Bond Formation in Chemical Reactions

The research team of the Center for Nanomaterials and Chemical Reactions at the Institute for Basic Science (IBS) has successfully visualized the entire process of bond formation in solution by using femtosecond time-resolved X-ray liquidography (femtosecond TRXL) for the first time in the world. [More]
DECTRIS Ltd. Announces New MYTHEN2 R Microstrip X-Ray Detectors for OEM use in Laboratory Diffractometers

DECTRIS Ltd. Announces New MYTHEN2 R Microstrip X-Ray Detectors for OEM use in Laboratory Diffractometers

DECTRIS Ltd. has announced its new generation of MYTHEN2 R high-performance microstrip X-ray detectors for OEM use in laboratory and portable diffractometers. [More]
Park Systems Joins Forces with imec to Develop Advancements in Nanoscale AFM Metrology Solutions for Semiconductor Manufacturing

Park Systems Joins Forces with imec to Develop Advancements in Nanoscale AFM Metrology Solutions for Semiconductor Manufacturing

Park Systems, world-leader in Atomic Force Microscopes (AFM) announced today they have signed a Joint Development Project (JDP) with nanoelectronics research center imec, to develop in-line AFM metrology solutions of future technology nodes including but not limited to surface roughness, thickness, critical dimension (CD), and sidewall roughness. [More]
New Metrology System Can Detect Defects at the Nanoscale

New Metrology System Can Detect Defects at the Nanoscale

RESEARCH at the University of Huddersfield will lead to major efficiency gains and cost savings in the manufacture of flexible solar panels. It has also resulted in an exceptional number of scholarly articles co-authored by a Libyan scientist who is completing his doctoral studies as a participant in the EU-backed project. [More]