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SEMTech Solutions Announces Plans to Attend EIPBN Conference

SEMTech Solutions, Inc. has announced plans to attend and host a booth at the 53rd International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication (EIPBN). The EIPBN Conference is recognized...

6 May 2009

Leica Microsystems Develop Microscope System for Measuring Impurities

The cleanliness of high-performance safety-relevant components is an essential factor for reliability and a long lifetime. Leica Microsystems developed a microscope system for measuring impurities in cleaning liquids for micromechanic and motor components during production which has been used with great success for quantitative cleanliness analysis in the automobile and many other industries.

From Leica Microsystems GmbH 6 May 2009

An Efficient New Approach to Measure Key Structural Properties of Nanoscale Metal-Oxide Films

By modifying a commonly used commercial infrared spectrometer to allow operation at long-wave terahertz frequencies, researchers at the National Institute of Standards and Technology (NIST) discovered an efficient new approach to measure key structural properties of nanoscale metal-oxide films used in high-speed integrated circuits.

5 May 2009

Nano-Vise Putting the Squeeze on a Crystal Leads to Novel Electronics

A clever materials science technique that uses a silicon crystal as a sort of nanoscale vise to squeeze another crystal into a more useful shape may launch a new class of electronic devices that remember their last state even after power is turned off.

5 May 2009

Axio Imager Setting New Standards in Materials Microscopy

The second generation of the Axio Imager microscope system from Carl Zeiss is setting new standards in materials microscopy. Whether in quality testing and assurance, in materials analysis or the development of future materials - optical quality, performance and comfort are the major benefits of the Axio Imager. The

From Carl Zeiss Microscopy GmbH 5 May 2009

New Functions Enable Materials Scientists to Measure Large Sample Areas More Conveniently

The new functions of the Axio CSM 700 confocal light microscope from Carl Zeiss enable materials scientists to measure large sample areas more conveniently and use the system more flexibly.

From Carl Zeiss Microscopy GmbH 5 May 2009

Chameleon Vision from Coherent Intended to Maximize the Potential of Multiphoton Microscopy Techniques

The new Chameleon™ Vision from Coherent Inc. (Santa Clara, CA) (Nasdaq: COHR) is a fully-integrated laser source for Multiphoton Excitation (MPE) microscopy that delivers both state-of-the-art image quality and superior ease of use.

From Coherent Inc. 5 May 2009

Insights into Creating Ever-Sharp Tools or Mechanical Parts

Sea urchins dig themselves hiding holes in the limestone of the ocean floor using teeth that don't go blunt. Weizmann Institute scientists have now revealed their secrets, which might give engineers insights into creating ever-sharp tools or mechanical parts.

4 May 2009

Stony Brook University Home to the New Northeastern Chemical Energy Storage Center

“This award is a great example of the world-class energy research that is being conducted at Stony Brook University,” said Dr. Shirley Kenny, Stony Brook University President. “Clare Grey is an outstanding scientist; she is to be congratulated for her successful efforts in collaborating with colleagues from other institutions in this critical area.”

4 May 2009

Third-Generation of Synchrotron Radiation Light Source Ready for Use

Shanghai Synchrotron Radiation Facility (SSRF), a third-generation of synchrotron radiation light source, is completed and ready for use. Located in Shanghai Zhangjiang Hi-Tech Park, the 1,200-million-yuan mega projec...

4 May 2009