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SEMATECH Experts Report Progress on Enabling EUVL

SEMATECH and International SEMATECH Manufacturing Initiative (ISMI) experts will present world-leading research and development results on extreme ultraviolet (EUV) manufacturability and extendibility, alternative lithog...

From SEMATECH 11 Feb 2009

Veeco to Host Event for the Nanoscience Community

Veeco Instruments
Inc. (Nasdaq: VECO), the leading provider of atomic force microscopes (AFMs)
to the nanoscience community, announced today that it will host the “Seeing
at the Nanoscale VII” conference at the University of California, Santa
Barbara (UCSB), July 28–31, 2009.

From Veeco 11 Feb 2009

Researchers Demonstrate Breakthrough in Optical Nanoscopy

A collaborative effort between researchers at the University of Colorado at Boulder and Stanford University has demonstrated a breakthrough in optical nanoscopy, the science of imaging and sensing of nanoscale objects. ...

10 Feb 2009

PANalytical Launches New Standardless XRF Analysis Package at PITTCON 2009

PANalytical, the world's leading X-ray analysis company, will launch Omnian, its new standardless XRF analysis package, and will present a wide range of X-ray fluorescence (XRF) spectrometry and X-ray diffraction (XRD) solutions at the PITTCON 2009 Conference + Expo (March 8-13, 2009, Chicago, IL, USA).

10 Feb 2009

Agar Scientific Now in Position to Supply Kleindiek Micromanipulator to UK and Irish Markets

Agar Scientific is pleased to announce that they are now in a position to supply the Kleindiek micromanipulator to the UK and Irish markets.

From Kleindiek Nanotechnik 9 Feb 2009

QDI 2010 Microspectrophotometer Enable Hard Disk Manufactures to Rapidly Detect Contamination

Trace amounts of organic and inorganic contaminants of hard disk components are extremely difficult to detect by current methods. Common techniques, such as inspection with optical microscopes will not show any of the contamination that is affect the products.

9 Feb 2009

Asylum Research Scientists to Present Work in Piezoresponse Force Microscopy at MRS Spring Meeting

Asylum Research scientists will be presenting their recent work in Piezoresponse Force Microscopy (PFM) at the upcoming MRS Spring Meeting, Session JJ, in San Francisco, CA on April 15-17, 2009.

From Asylum Research - An Oxford Instruments Company 9 Feb 2009

IMEC Matures its Flexible Radios in Deep Sub-Micron Digital CMOS

With the launch of its single-chip reconfigurable receiver achieving industry state-of-the-art performance, IMEC matures its flexible radios in deep sub-micron digital CMOS to ease the implementation of both the analog and the digital functionality into the same system-on-chip (SoC).

From IMEC 9 Feb 2009

New In-line Capability Provides Accelerated Probe Test Failure Analysis and Lower Cost of Ownership

Rudolph Technologies, Inc. (NASDAQ: RTEC), a worldwide leader in process characterization solutions for the semiconductor manufacturing industry, today announced that the NSX® Series wafer inspection system now inclu...

From Rudolph Technologies 9 Feb 2009

Nanowire Lasers Setting World Record in Wavelength Tunability

A single semiconductor laser chip with world-record wavelength tuning range of 200 nanometers - from 500 to 700 nanometers - has been demonstrated by a research team led by Cun-Zheng Ning, a professor in the Department of Electrical Engineering in the Ira A. Fulton School of Engineering at Arizona State University.

8 Feb 2009