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Park Systems Announces Winner of AFM Image Contest 2014

Park Systems Announces Winner of AFM Image Contest 2014

Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997 announced today their first AFM image contest winner, Namuna Panday, a Graduate Student at Florida International University. [More]
New AFM Technology from Park Systems Improves Accuracy and Lowers Cost in Semiconductor Failure Analysis

New AFM Technology from Park Systems Improves Accuracy and Lowers Cost in Semiconductor Failure Analysis

The newly designed and innovative Park Systems PinPoint iAFM effectively solves the issues of traditional AFM thereby providing the most optimum solution to the FA engineers’ needs available in the nanotechnology industry today. [More]
Atomic Force Microscope Tip Used to Pull up Isolated Molecular Chains from a Gold Surface

Atomic Force Microscope Tip Used to Pull up Isolated Molecular Chains from a Gold Surface

In collaboration with colleagues from Berlin and Madrid, researchers at the Department of Physics at the University of Basel have pulled up isolated molecular chains from a gold surface, using the tip of an atomic force microscope (AFM). The observed signal provides insight into the detachment force and binding energy of molecules. The results have been published in the renowned scientific journal PNAS. [More]
Asylum Research to Hold Webinar on Their New blueDrive Photothermal AFM Technique

Asylum Research to Hold Webinar on Their New blueDrive Photothermal AFM Technique

Asylum Research, an Oxford Instruments company, will host a new webinar on March 20, “AFM Imaging and Nanomechanics with blueDrive Photothermal Excitation”. blueDrive is a new option available on the Asylum Research Cypher AFM that reinvents tapping mode imaging for remarkably simple, incredibly stable, and strikingly accurate operation. [More]

AFM-IR Used to Study and Optimize Biofuel-Producing Microbes

Anasys Instruments reports on the publication in the Journal of Physical Chemistry Letters demonstrating the use of AFM-IR used by French researchers to identify best microbes for biofuel production. While the deb... [More]
JPK CellHesion® 200 Used for Cancer Cell Studies at University Hospital Münster

JPK CellHesion® 200 Used for Cancer Cell Studies at University Hospital Münster

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on the current cancer research project of Dr Florian T Ludwig at the Institute of Physiology II, University Hospital Münster, who uses a CellHesion® 200 to measure the adhesive forces between tumor cells. [More]
Carbon Design Innovations Launch New Performance Family of Carbon Nanotube AFM Probes

Carbon Design Innovations Launch New Performance Family of Carbon Nanotube AFM Probes

Carbon Design Innovations, Inc. (C|D|I), the leading manufacturer of carbon nanotube (CNT) probes for Atomic Force Microscopy (AFM), today announced its new Performance Family of CNT Probes for AFM imaging. [More]

UT Austin Researchers Demonstrate Resonance-Enhanced AFM-IR Analysis Using Anasys Instruments Technology

Anasys Instruments reports on the publication in Nature Photonics from Prof. Belkin (The University of Texas at Austin) demonstrating the use of resonance-enhanced AFM-IR with unprecedented sensitivity. ... [More]
NIMS Develops Method for Controlling Molecular Self-Organization

NIMS Develops Method for Controlling Molecular Self-Organization

The National Institute of Materials Science (NIMS) developed a method for controlling the molecular self-organization, the process that is significant for synthesizing functional materials, and succeeded for the first time in the world in controlling the length of a one-dimensional assembly of molecules (supramolecular polymer). [More]
Scanning Microwave Impedance Microscopy Announced By Asylum Research

Scanning Microwave Impedance Microscopy Announced By Asylum Research

Asylum Research, an Oxford Instruments company, announces Scanning Microwave Impedance Microscopy (sMIM), an atomic force microscopy (AFM) technique that enables nanoscale mapping of permittivity and conductivity with unprecedented sensitivity and resolution on any material including conductors, semiconductors and insulators.
[More]
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