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TU Braunschweig use NanoWizard® AFM System from JPK to Study the Properties of DNA and DNA Nanostructures

TU Braunschweig use NanoWizard® AFM System from JPK to Study the Properties of DNA and DNA Nanostructures

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on the use of their AFM system, the NanoWizard®, in the Nanobiosciences Group of the Institute of Physical & Theoretical Chemistry at the Technical University of Braunschweig. It is being used to study DNA and DNA nanostructures. [More]
Ardic Instruments Announces the P300 Modular Atomic Force Microscope that Scales With Experimental Needs

Ardic Instruments Announces the P300 Modular Atomic Force Microscope that Scales With Experimental Needs

The P300 atomic force microscope is a highly modular system designed to address constantly changing experimental needs. Built with flexibility in mind, the P300 can accommodate for a variety of resolutions, scan speeds, scan ranges, and budgets. [More]
Bruker Introduces Integrated AFM-TERS System for Nano-Raman Spectroscopy Research

Bruker Introduces Integrated AFM-TERS System for Nano-Raman Spectroscopy Research

Bruker has introduced a dedicated Tip-Enhanced Raman Spectroscopy (TERS) system - Innova-IRIS. The instrument allows label-free and non-destructive, nanoscale detection of chemicals and can be used for a variety of research applications. [More]
Nanorobotic Techniques and AFM Help Study Pathology of Autoimmune Skin Disease

Nanorobotic Techniques and AFM Help Study Pathology of Autoimmune Skin Disease

University at Buffalo researchers and colleagues studying a rare, blistering disease have discovered new details of how autoantibodies destroy healthy cells in skin. This information provides new insights into autoimmune mechanisms in general and could help develop and screen treatments for patients suffering from all autoimmune diseases, estimated to affect 5-10 percent of the U.S. population. [More]
FEI Announces Release of Next-Generation, Industry-Leading Helios NanoLab DualBeam

FEI Announces Release of Next-Generation, Industry-Leading Helios NanoLab DualBeam

FEI announced today the release of the next generation of its industry-leading Helios NanoLab™ DualBeam™. The Helios NanoLab G3 DualBeam extends the Helios family's leadership position with unmatched image contrast and resolution, while at the same time, adding a new, easy-to-use user interface. [More]
NT-MDT Announces Price Reduction on The NEXT AFM

NT-MDT Announces Price Reduction on The NEXT AFM

NT-MDT, a premier global provider of innovative AFM and SPM operating in the field for over 25 years, is announcing a significant price reduction for a limited period on the NEXT AFM. [More]
EPFL Poster on AFM-IR Technique Application Becomes Winner at Swiss Physics Society Meeting

EPFL Poster on AFM-IR Technique Application Becomes Winner at Swiss Physics Society Meeting

Anasys Instruments reports on EPFL’s Francesco Simone Ruggeri success winning a poster award at the recent annual meeting of the Swiss Physics Society held at the University of Fribourg. [More]
Physicists Construct ‘Swiss Cross’ with 20 Single Atoms

Physicists Construct ‘Swiss Cross’ with 20 Single Atoms

The manipulation of atoms has reached a new level: Together with teams from Finland and Japan, physicists from the University of Basel were able to place 20 single atoms on a fully insulated surface at room temperature to form the smallest "Swiss cross", thus taking a big step towards next generation atomic-scale storage devices. The academic journal Nature Communications has published their results. [More]
JPK Reports on The use of Their AFM System the NanoWizard® at Swansea University

JPK Reports on The use of Their AFM System the NanoWizard® at Swansea University

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on the use of their AFM system, the NanoWizard® in the Physics Department at Swansea University. [More]
Park Systems Announces New NX-Wafer for Bare Wafer Manufacturing

Park Systems Announces New NX-Wafer for Bare Wafer Manufacturing

Park Systems, a leading manufacturer of atomic force microscopy (AFM) products announces Park NX-Wafer, a revolutionary AFM design for bare wafer manufacturing that fully automates the automatic defect review process and increases production throughput by an astounding 1,000%. Park NX-Wafer produces sub-Angstrom roughness measurements for the flattest substrates and wafers with tip-to-tip variation of less than 2%, for the first time ever in the entire history of the semiconductor industry. [More]