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JPK Reports on the Use of the NanoWizard® 3 AFM System at the Hebrew University of Jerusalem

JPK Reports on the Use of the NanoWizard® 3 AFM System at the Hebrew University of Jerusalem

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on the use of their NanoWizard® AFM system in the Institute of Chemistry of the Hebrew University of Jerusalem. [More]
Nanoscience Instruments Announce New AFM with High Definition Electrical Measurement Capabilities

Nanoscience Instruments Announce New AFM with High Definition Electrical Measurement Capabilities

Nanoscience Instruments introduces the Nano-Observer, a new research atomic force microscope (AFM) designed with advanced nanoscale electrical characterization capabilities. The Nano-Observer opens up new applications in advanced materials development at an extremely attractive price point. [More]
Bruker Announces Official Partnership with University of Manchester’s National Graphene Institute

Bruker Announces Official Partnership with University of Manchester’s National Graphene Institute

Bruker Corporation today announced an official partnership with the University of Manchester’s National Graphene Institute (NGI), joining a select list of industrial collaborators. [More]
Oxford Instruments Asylum Research Will Present Two-Part Webinar Series on Piezoresponse Force Microscopy in May 2015

Oxford Instruments Asylum Research Will Present Two-Part Webinar Series on Piezoresponse Force Microscopy in May 2015

Oxford Instruments Asylum Research will host a two-part webinar series on Piezoresponse Force Microscopy (PFM), May 4 and May 6, 2015. Presenters include Dr. Sergei V. Kalinin, Director at the Institute for Functional Imaging of Materials and Theme Leader at the Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, and Asylum Research President and co-founder, Dr. Roger Proksch. [More]
New Partnership Provides Quality Training Programs in Atomic Force Microscopy

New Partnership Provides Quality Training Programs in Atomic Force Microscopy

Dalia Yablon, Ph.D. and Paul E. West, Ph.D, two leading experts in scanning probe/atomic force microscopy (SPM/AFM) with decades of experience between them, are teaming up to help de-mystify their field and make it more accessible to scientists and engineers. [More]
Researchers Optimize New AFM System for Live-Cell Imaging

Researchers Optimize New AFM System for Live-Cell Imaging

Researchers at the Max Planck Florida Institute for Neuroscience and Kanazawa University (Japan) have succeeded in imaging structural dynamics of living neurons with an unprecedented spatial resolution [More]
Park and imec Partner to Develop Nanoscale AFM Metrology Solutions for Semiconductor Wafer Production

Park and imec Partner to Develop Nanoscale AFM Metrology Solutions for Semiconductor Wafer Production

Park Systems, world-leader in Atomic Force Microscopes (AFM) announced today they have signed a Joint Development Project (JDP) with nanoelectronics research center imec, to develop in-line AFM metrology solutions of future technology nodes including but not limited to surface roughness, thickness, critical dimension (CD), and sidewall roughness. [More]
Park Systems Joins Forces with imec to Develop Advancements in Nanoscale AFM Metrology Solutions for Semiconductor Manufacturing

Park Systems Joins Forces with imec to Develop Advancements in Nanoscale AFM Metrology Solutions for Semiconductor Manufacturing

Park Systems, world-leader in Atomic Force Microscopes (AFM) announced today they have signed a Joint Development Project (JDP) with nanoelectronics research center imec, to develop in-line AFM metrology solutions of future technology nodes including but not limited to surface roughness, thickness, critical dimension (CD), and sidewall roughness. [More]
AXT Announce Distribution Partnership with NT-MDT in Australia and New Zealand

AXT Announce Distribution Partnership with NT-MDT in Australia and New Zealand

AXT would like to announce its new partnership with NT-MDT, one of the world’s leading manufacturers of Atomic Force Microscopes (AFM). [More]
Conventional Patch-Clamp Technique Combined with AFM Helps Record Activity of Moving Cells

Conventional Patch-Clamp Technique Combined with AFM Helps Record Activity of Moving Cells

Electrical impulses play an important role in cells of the human body. For example, neurons use these impulses to transmit information along their branches and the body also uses them to control the contraction of muscles. [More]
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