Atomic Force Microscopes News RSS Feed - Atomic Force Microscopes

Herzan Announce New NanoDamp Series - High-Performance Vibration Isolation for Laboratory Workstations

Herzan Announce New NanoDamp Series - High-Performance Vibration Isolation for Laboratory Workstations

Herzan LLC announces the release of The NanoDamp Series – Herzan’s line of research grade workstations, carefully designed to address vibration noise for a variety of applications. [More]
Park Systems Develops Platform for Nanoscale PTR Measurements in Collaboration with Hard Drive Manufacturers

Park Systems Develops Platform for Nanoscale PTR Measurements in Collaboration with Hard Drive Manufacturers

Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, proudly introduces itsnext generation NX-PTR, a fully automated system for hard disk drive slider manufacturing. Newly developed in collaboration with leaders in the hard disk drive (HDD) production, Park's NX-PTR increases production yield by 200% with an enhanced automation routine, faster scan rate and recipe automation. [More]
Researchers Demonstrate Superiority of AFM Probe Tips Made from Near-Perfect GaN Nanowires

Researchers Demonstrate Superiority of AFM Probe Tips Made from Near-Perfect GaN Nanowires

In response to requests from the semiconductor industry,* a team of PML researchers has demonstrated that atomic force microscope (AFM) probe tips made from its near-perfect gallium nitride nanowires are superior in many respects to standard silicon or platinum tips in measurements of critical importance to microchip fabrication, nanobiotechnology, and other endeavors. [More]
Multiple Pathways Found in Growth Mechanism of Zeolites

Multiple Pathways Found in Growth Mechanism of Zeolites

Researchers have found the first definitive evidence of how silicalite-1 (MFI type) zeolites grow, showing that growth is a concerted process involving both the attachment of nanoparticles and the addition of molecules. [More]
Soft-Touch' AFM Helps Determine DNA Structure from Measurements on a Single Molecule

Soft-Touch' AFM Helps Determine DNA Structure from Measurements on a Single Molecule

Researchers at the National Physical Laboratory (NPL) and the London Centre for Nanotechnology (LCN) have determined the structure of DNA from measurements on a single molecule using atomic force microscopy (AFM), and found significant variations in the well-known double helix. [More]
AFM Combined with Infrared Synchrotron Light Improves Spatial Resolution of Infrared Spectroscopy

AFM Combined with Infrared Synchrotron Light Improves Spatial Resolution of Infrared Spectroscopy

For years, scientists have had an itch they couldn’t scratch. Even with the best microscopes and spectrometers, it’s been difficult to study and identify molecules at the so-called mesoscale, a region of matter that ranges from 10 to 1000 nanometers in size. [More]
JPK's Quantitative Imaging Mode Used by Niigata University for Tissue Engineering Studies

JPK's Quantitative Imaging Mode Used by Niigata University for Tissue Engineering Studies

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on the use of the Quantitative Imaging mode for tissue engineering studies at Niigata University. [More]
Novel Technique Combining AFM and Mass Spectrometry Allows Simultaneous Chemical, Physical Characterization

Novel Technique Combining AFM and Mass Spectrometry Allows Simultaneous Chemical, Physical Characterization

Anasys Instruments Corp. has licensed a Department of Energy Oak Ridge National Laboratory technology that allows for simultaneous chemical and physical characterization and could lead to advances in materials and drug development. [More]
Researchers Explain Behavior of Electrons at Tiny Step Edges on Titanium Oxide Surfaces

Researchers Explain Behavior of Electrons at Tiny Step Edges on Titanium Oxide Surfaces

It can be found in toothpaste, solar cells, and it is useful for chemical catalysts: titanium dioxide (TiO2) is an extremely versatile material. Alhough it is used for so many different applications, the behaviour of titanium oxide surfaces still surprises. [More]
Novel Reusable Probe for AFM Enables Precision and Stability in Picoscale Force Measurements

Novel Reusable Probe for AFM Enables Precision and Stability in Picoscale Force Measurements

JILA researchers have engineered a short, flexible, reusable probe for the atomic force microscope (AFM) that enables state-of-the-art precision and stability in picoscale force measurements. Shorter, softer and more agile than standard and recently enhanced AFM probes, the JILA tips will benefit nanotechnology and studies of folding and stretching in biomolecules such as proteins and DNA. [More]