NeoScope JCM-5000 Benchtop Scanning Electron Microscope (SEM) from JEOL
Mike Wolfe from Nikon Instruments, the distributor for the JEOL
NeoScope JCM-5000 in North America and Canada demonstrates the capabilities
if this compact benchtop scanning electron microscope (SEM), which is a natural
extension from high end optical microscopes, but offers much better depth of
field.
The NeoScope JCM-5000 is supplied as a turnkey solution incorporating rotary
pump, computer and SEM with magnification from 10-20000 times. The unit can
operate in either high or low vacuum modes and includes backscatter and secondary
electron detectors.
Mike demonstrates how easy it is to load a sample and the user-friendly software
interface that can be operated by users with limited SEM experience.
Run time - 7:39min
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