Posted in | Nanoanalysis

SEM/STEM Observation of Pt/C Catalysts Using Hitachi HF-3300 Microscope

This video shows the SEM and STEM characterization of Pt/C catalyst with the help of HF-3300 microscope from Hitachi. When air is injected into the area where the specimen is kept, reaction takes place between Pt nanoparticles and carbon support, which forms holes on carbon surface and the nanoparticles sink on the surface. Combination of high reputation Hitachi cold field emission electron source and 300 kV accelerating voltage realizes both ultrahigh resolution imaging and high sensitivity analysis.

Run Time – 0.59sec

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