Capabilities and Key Features of the Park Systems XE-NSOM AFM

Dr. David Faddis from Park Systems demonstrates the XE-NSOM AFM. The XE-NSOM belongs to the XE range of atomic force microscopes and features a decoupled x-y and z scanners which eliminates cross talk and improves image quality.

The XE-NSOM features near-field scanning optical micropscopy capabilities. It can be used in both transmission and reflectance modes for transparent and opaque samples. The XE-NSOm can also be coupled with Raman capabilities for increased analytical power.

Being part of the XE range of AFM's the XE-NSOM also features an easily removable scan head for rapid tip changes, a flexure stage design and various modes of operation.

Dr Faddis also provides a detailed run down of trhe workings of the XE-NSOM AFM.

Run time - 6:47min

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