Site Sponsors
  • Oxford Instruments Nanoanalysis - X-Max Large Area Analytical EDS SDD
  • Strem Chemicals - Nanomaterials for R&D
  • Park Systems - Manufacturer of a complete range of AFM solutions

Capabilities and Key Features of the Park Systems XE-NSOM AFM

Dr. David Faddis from Park Systems demonstrates the XE-NSOM AFM. The XE-NSOM belongs to the XE range of atomic force microscopes and features a decoupled x-y and z scanners which eliminates cross talk and improves image quality.

The XE-NSOM features near-field scanning optical micropscopy capabilities. It can be used in both transmission and reflectance modes for transparent and opaque samples. The XE-NSOm can also be coupled with Raman capabilities for increased analytical power.

Being part of the XE range of AFM's the XE-NSOM also features an easily removable scan head for rapid tip changes, a flexure stage design and various modes of operation.

Dr Faddis also provides a detailed run down of trhe workings of the XE-NSOM AFM.

Run time - 6:47min

Tell Us What You Think

Do you have a review, update or anything you would like to add to this video content?

Leave your feedback
Submit
Other Videos by this Supplier
Nanotechnology Videos by Subject Matter