Ambios Technology Q-View SPM/Interferometer - Capabilities

Rick Olds from Ambios Technology will shows us the Q-View.

The Q-View combines scanning probe microscopy (SPM) and interferometer which are interchangeable. The Q-View uses an isolation chamber which provides acoustic and vibration insulation. It also allows the measurement of surface roughness over larger areas using interferometry or more high precision measurements over smaller areas using the SPM.