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Posted in | Nanoanalysis

Microanalysis Demonstration of X-Max Silicon Drift Detector SDD by Oxford Instruments

An instructional video illustrating the amazing results now achieveable with the X-Max SDD detector. The latest Oxford Instruments' energy dispersive x-ray spectrometer.

The new X-Max Silicon Drift Detector (SDD) offers users over TEN times the solid angle of conventional EDS detectors... without compromising on performance. Now you can have count rate, imaging, and analytical performance all at the same time.

Run time 3.35 mins

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