The FEI Phenom Personal Electron Microscope as A Teaching Tool at NCSU
Validating samples is a time consuming and expensive process when trying to
track down defects and reasons for semiconductor failures. Optical microscopes
were used to examine samples after each polishing stage, but they do not have
the resolution to detect the small defects that are now being produced. With
its small footprint, higher resolution and comparable price, the FEI
Phenom personal electron microscope is the ideal alternative. It also offers
faster sample analysis and imaging compared to many other scanning electron
Run time - 2:42min
The compact size and ease of use have enabled staff at NCSU to take the FEI
Phenom personal electron microscope out of the dedicated research labs and
bring it into the teaching environment.
In this video they use the FEI
Phenom for analyzing nanofibres.
Run time - 3:15 min