Posted in | Nanoanalysis

The FEI Phenom Personal Electron Microscope as A Teaching Tool at NCSU

Validating samples is a time consuming and expensive process when trying to track down defects and reasons for semiconductor failures. Optical microscopes were used to examine samples after each polishing stage, but they do not have the resolution to detect the small defects that are now being produced. With its small footprint, higher resolution and comparable price, the FEI Phenom personal electron microscope is the ideal alternative. It also offers faster sample analysis and imaging compared to many other scanning electron microscopes.

Run time - 2:42min

The compact size and ease of use have enabled staff at NCSU to take the FEI Phenom personal electron microscope out of the dedicated research labs and bring it into the teaching environment.

In this video they use the FEI Phenom for analyzing nanofibres.

Run time - 3:15 min

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