XE-100 Series AFMs from Park Systems

Dr. Sang-il Park, the CEO of Park Systems shows us their XE-100 series general purpose AFMs. He explains how the use of a x-y scanner and decoupled z scanner produces very flat scans and how their system can operate in a true non-contact mode to produce accurate, high resolution images, with excellent reproducibility. The XE-100 series AFMs can be adapted to measure electrical, magnetic, mechanical and optical properties in addition to topographical properties.

In addition to this, they also have a system that can characterize biological samples. He also goes on to explain Scanning Ion Conductance Microscopy (SICM) technology, which is unique to Park Systems. This technique uses pipettes in place of normal probes to measure various electrophysiologies, similar to the patch clamp technique and opens up new possibilities for nanobiologists..

Run Time - 5:28min

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