Posted in | Nanoanalysis

Demonstration of MagicScan Technology by AIST-NT

Video demonstration of MagicScan Technology by AIST-NT. AFM image of Test Grating (3 microns pitch, 25 nm height), semicontact AFM mode, probe resonance frequency - 500 kHz, 30x30 microns scan area, 400x400 points. Scan rate increases from 2 to 20 lines per second.

AIST-NT MagicScan technology demo, 30 microns

Run time: 3.34 mins

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