Demonstration of MagicScan Technology by AIST-NT - 12 Microns Scan Area
Video demonstration of MagicScan Technology by AIST-NT.
AFM image of Test Grating (3 microns pitch, 25 nm height), semicontact AFM mode,
probe resonance frequency - 500 kHz, 12?12 microns scan area, 300x300 points.
Scan rate increases from 3 to 30 lines per second.
Run time: 3.04 mins