Inventor of C-Therm's Sensor Tech Wins the Top Award for Innovation
The development of the modified transient plane source technique by C-Therm
Technologies (formerly Mathis Instruments) represents a paradigm shift in
thermal measurement. The technology is capable of rapidly testing a wide range
of materials in measuring thermal conductivity and effusivity (thermal inertia).
With virtually no restrictions on sample size, C-Therm's
sensor technology allows thermal testing of materials not previously possible.
The external sensor can obtain accurate readings from samples as small as 17
mm diameter, with a minimum thickness of 0.5 mm. The maximum sample size and
thickness is unlimited.This key advantage has generated broad interest and application
of the technology in manufacturing sectors, allowing quality control testing
of finished or in-process goods without damaging or disassembling them. For
her role in the development of the technology, Dr. Nancy Mathis (original founder
of Mathis Instruments) won the coveted Manning Innovation Principal Award in
Run time: 5.55 mins