PUMA Darkfield Patterned Wafer Inspectors from KLA Tencor

This video shows the PUMA family of laser imaging, darkfield patterned wafer inspectors from KLA Tencor. The high-speed wafer inspectors are highly sensitive, and have unique optical modes as well as multiple pixel options.

These laser-based optical inspection systems effectively disposition wafers and enhance the predictability of the chipmaking process by obtaining crucial defects at high production throughputs.

Run Time - 1:14min

Tell Us What You Think

Do you have a review, update or anything you would like to add to this video content?

Leave your feedback
Submit
Other Videos by this Supplier
Nanotechnology Videos by Subject Matter