Nanotechnology Videos

CAMSIZER P4 - RETSCH TECHNOLOGY - Short Introduction

The CAMSIZER P4 particle analyzer has been developed to comprehensively characterize dry, free flowing bulk materials.

Video of a Graphene Covered Wooden Strip Undergoing a Verticle Burning Test

The video shows the differing behaviours of a graphene covered wooden strip and a non-graphene covered wooden strip undergoing a verticle burning test.

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Video to Show Virtual Pivot Point Kinematics

Using the ROTATION command, a user can program offsets based on their desired rotation point and associate different axes of motion with specific rotations within the motion system.

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'The Complete Tribology Lab' - The New UMT from Bruker

Bruker's UMT Universal Mechanical Tester. The UMT is the "complete tribology lab" and provides macro, micro and nanoscale tests under real-world conditions. Talking to Bruker's Steve Shaffer and University of Sheffield's Mark Rainforth, they discuss the ease of use and the typical applications of the UMT.

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Video to Show Graphene Covered Sawdust Undergoing a Smoke and Volatile Compound Suppression Test

This video shows the differing behaviours of graphene and non-graphene covered sawdust undergoing a smoke and volatile compound suppression test.

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The Zeta-20 Optical Profilometer from Zeta Instruments

Ben Garland from Zeta Instruments demonstrates their Zeta-20 Optical Profilometer which can measure surface and textural properties of materials such as solar cells, microfluidics, biologicals etc.

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The EM TIC 3X Milling System from Leica Microsystems

The EM TIC 3X Milling System surpasses conventional slope cutting instruments. It can mill at high rates, cut broad and deep into the sample, and create smooth surfaces resulting in high-quality cross-sections of almost any material, quickly and easily.

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Field of View from A Laser Scanner System

Aerotech's Infinite Field of View software feature solves these problems without compromising on field-of-view OR spot size.

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What is Graphene? - Animated Video by Bluestone Global Tech

An animated video to explain why graphene matters from Bluestone Global Tech

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Materials Characterization with the NanoIR from Analsys Instruments

Curt Marcott from Light Light Solutions tells us how the NanoIR from Anasys Instruments has opened up new possibilities in materials characterization. Combining AFM and IR spectroscopy provides spatial resolution an order of magnitude better than conventional IR, which enables researchers to do such things as examine nanoparticles in a matrix, or analyze for compositions differences across in interface.

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Particle Analysis with the CAMSIZER® P4 – Retsch Technology

The CAMSIZER P4 particle analyzer has been developed to comprehensively characterize dry, free flowing bulk materials. Whereas traditional sieve analysis, for example, can only determine the approximate particle size, the CAMSIZER P4 simultaneously measures both particle size and shape – with much more detail and at a higher resolution.

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Video to Show Automated Alignment Algorithms

Using analog voltage feedback, the controller monitors power levels and associates them with a specific position, and sets the final position of the motion at the highest power point based on user-defined parameters.

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Simulation of Fiber Optic Array Alignment

Using Aerotech's A3200 controller, users are able to automatically align multichannel optical devices for assembly.

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Video Comparing the Rate Wood With and Without a Graphene Cover Burns

In this video graphene demonstrates it's flame retardant capabilities by comparing a graphene covered wooden slab to a non-graphene coated wooden slab.

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CAMSIZER X2 - RETSCH TECHNOLOGY - Short Introduction

The quality control of fine powders can be substantially improved with the new CAMSIZER X2: More precise and faster analysis of particle size and particle shape helps to improve the product quality, reduce rejects and save labor costs, energy and raw materials.

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Microtrac MRB Company Video - Solutions in Particle Sizing

Microtrac MRB's core competence is to combine innovative particle characterization technology with maximum operating convenience.

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AUTOSAMPLER for CAMSIZER P4 - RETSCH TECHNOLOGY - Short Introduction

Whenever varying sample materials are to be analyzed or repeat measurements need to be carried out, the AutoSampler adapts perfectly to the defined measuring routine.

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Studying Graphene with Raman Spectrometers - The Benefits

Professor Robert J Young of the National Graphene Institute and School of Materials, University of Manchester discusses using Raman Spectroscopy to study graphene.

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Zeta Instruments - Optical Profiler - Pittcon 2012

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Video to Show Verticle Burning Test of Graphene Covered Paper

This video demonstrates the differing behaviours of non-graphene covered and graphene covered paper undergoing a verticle burning test.

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Electrochemical Strain Microscopy and the Cypher AFM from Asylum Research

Asylum Research introduced the Cypher AFM two years ago. They have now added a new technique called Electrochemical Strain Microscopy to its list of capabilities. Sergei Kalinin from Oak Ridge National Laboratory explains how this technique can be used to characterize electrochemical phenomena at the nanoscale and Roger Proksch from Asylum Research demonstrates how the system produces data and its relevance to the field of battery materials.

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Particle X-Plorer Software Module - RETSCH TECHNOLOGY

The RETSCH TECHNOLOGY software module Particle X-Plorer is used in both our particle analysis systems CAMSIZER P4 and CAMSIZER X2 and offers the user a wealth of features and possibilities to obtain in-depth knowledge of his sample.

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The Malvern Instruments Mastersizer 3000 Particle Size Analyzer

Julie Chen from Malvern Panalytical gives us a tour of the new Mastersizer 3000 particle size analyzer. She outlines the upgrades from the previous generation Mastersizer 2000.

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Optical Profiler - The ContourGT-X8 from Bruker

Eric Rufe from Bruker Nano Surfaces shows us their ContourGT-X8 optical profiler. It is effectively a 3-dimensional microscope and features the 10th generation of this technology.

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The Multiview AFM/Raman System from Nanonics Imaging

David Lewis from Nanonics Imaging Ltd shows us their Multiview Series of AFM/Raman systems that can be supplied with Renishaw or Horiba Raman systems. Nanonics can also supply the Multiview systems as upgrades to existing Raman systems of total systems.

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CAMSIZER X2 - Product Video

The quality control of fine powders can be substantially improved with the new CAMSIZER X2: More precise and faster analysis of particle size and particle shape helps to improve the product quality, reduce rejects and save labor costs, energy and raw materials.

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