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Posted in | Atomic Force Microscopes | Nanoanalysis

Latest Updates on Metrology in HB-LED Applications

This webinar illustrates how nano surfaces solutions from Bruker combine to meet high-brightness light emitting diode (HB-LED) metrology capabilities in a highly cost-effective manner.

The 3D optical microscopes, atomic force microscope (AFM) and stylus profiler solutions offer measurement capabilities necessary for complete LED surface metrology.

Run Time – 20:53min

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