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Posted in | Nanoanalysis

Latest Improvements in Stylus Profilometer

This presentation from Bruker shows the latest improvements in the stylus profilometer – the DektakXT stylus profiler system. This stylus profiler allows unmatched repeatability of less than 5 Å and up to 40% improved scanning speeds.

The DektakXT is relevant for several application fields including: medical, microelectronics, scientific, aerospace, solar, automotive, semiconductor, materials science, high-brightness LED, etc.

Run Time – 5:25min

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