Site Sponsors
  • Oxford Instruments Nanoanalysis - X-Max Large Area Analytical EDS SDD
  • Strem Chemicals - Nanomaterials for R&D
  • Park Systems - Manufacturer of a complete range of AFM solutions
  • Technical Sales Solutions - 5% off any SEM, TEM, FIB or Dual Beam
Posted in | Nanoanalysis | Nanomaterials

Versa 3D DualBeam from FEI

This video shows the Versa 3D DualBeam SEM/FIB (scanning electron microscope/focused ion beam) from FEI. The DualBeam provides more capabilities for advanced material research and development.

The Versa 3D can easily characterize difficult samples at high resolution, explore surface features in the 3D and offer high quality sample preparation.

Run Time – 4:25min

Tell Us What You Think

Do you have a review, update or anything you would like to add to this video content?

Leave your feedback
Submit
Other Videos by this Supplier
Nanotechnology Videos by Subject Matter