Posted in | Nanoanalysis | Nanomaterials

Versa 3D DualBeam from FEI

This video shows the Versa 3D DualBeam SEM/FIB (scanning electron microscope/focused ion beam) from FEI. The DualBeam provides more capabilities for advanced material research and development.

The Versa 3D can easily characterize difficult samples at high resolution, explore surface features in the 3D and offer high quality sample preparation.

Run Time – 4:25min

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