11th International ELMI Meeting – Lumen Dynamics Group Inc. Introduces the X-Cite XP750 Fluorescence Microscopy
This video shows the introduction of the X-Cite XP750 fluorescence microscopy at 11th International ELMI (European light microscopy initiative) Meeting by Lumen Dynamics Group.
The X-Cite XP750 objective plane power sensor is designed especially for measuring power at the specimen level for fluorescence microscopy applications.
Run Time – 2:00 minutes.