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11th International ELMI Meeting – Lumen Dynamics Group Inc. Introduces the X-Cite XP750 Fluorescence Microscopy

This video shows the introduction of the X-Cite XP750 fluorescence microscopy at 11th International ELMI (European light microscopy initiative) Meeting by Lumen Dynamics Group.

The X-Cite XP750 objective plane power sensor is designed especially for measuring power at the specimen level for fluorescence microscopy applications.

Run Time – 2:00 minutes.

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