Site Sponsors
  • Oxford Instruments Nanoanalysis - X-Max Large Area Analytical EDS SDD
  • Strem Chemicals - Nanomaterials for R&D
  • Park Systems - Manufacturer of a complete range of AFM solutions
Posted in | Nanoanalysis

Bruker D8 Discover for Thin Film Analysis

This video shows how the high resolution Bruker D8 Discover X-ray diffractometer is used for thin film analysis.

The thickness, lattice constant, crystallographic orientation and quality of thin films can be determined by the D8 Discover.

Run Time – 3:13min

Tell Us What You Think

Do you have a review, update or anything you would like to add to this video content?

Leave your feedback
Other Videos by this Supplier
Nanotechnology Videos by Subject Matter