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Cypher Atomic Force Microscope from Asylum Research

In this video Maarten Rutgers, Staff Scientist Asylum Research introduces the Environmental Scanner, the second in a family of scanners, which adds full environmental control to the Cypher platform. It is the highest resolution fast scanning AFM.

The design is based around a cell constructed of inert materials, such as fused silica and FFKM, to enclose and control the sample environment. The modular design allows customization for measurements in nearly any environment.

Run Time – 1:20min

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