Posted in | Nanoanalysis

AURIGA Compact FIB-SEM by Carl Zeiss

This video shows the high-tech AURIGA Compact FIB-SEM. Users can leverage the Carl Zeiss CrossBeam technology and blend high resolution imaging with the milling performance of the focused ion beam. High material and topographical contrast of different kinds of samples can be obtained.

Run Time – 1:31min

Other Videos by this Supplier

Tell Us What You Think

Do you have a review, update or anything you would like to add to this video content?

Leave your feedback
Your comment type
Submit

Nanotechnology Videos by Subject Matter

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.