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Posted in | X-Ray Diffraction

Bruker’s XTrace Micro-Spot X-Ray Source

In this video Stephan Boehm, Project Manager, Micro-XRF for SEM, Bruker Nano Surfaces talks about the XTrace Micro-Spot X-Ray Source. XTrace is a new micro-spot X-ray source that enables photon-induced micro X-ray fluorescence (micro-XRF) spectrometry on SEM systems, in conjunction with Bruker’s energy dispersive X-ray spectrometer (EDS) detectors. The XTrace fits on a free inclined chamber port of almost any SEM. The user benefits from both the higher information depth of XRF analysis and the trace element sensitivity.

Run Time – 2:25min

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