JSM-iT300 SEM from JEOL
This video introduces JSM-IT300 scanning electron microscope from JEOL USA. The JSM-IT300 series is a high-performance, multi-purpose SEM capable of handling a variety of applications. These instruments feature a newly-designed user interface that permits operations to be performed via a touch panel, further enhancing the ease-of-use, in addition to debuting a sleek new exterior design.
Run Time – 3:42min