The Xi-100 Non-Contact Optical Interferometer from Ambios Technology quickly
and accurately measures the 3D topography of surfaces at the nanometer level.
It is designed for the researcher who is interested in getting fast, repeatable
date from an instrument that is not encumbered by unneeded levels of complication.
Rapidly image areas in scale from microns to millimeters and the only instrument
adjustments are sample position and focus.
Main features:
Fast, non-destructive, 3-dimensional measurements
Point and shoot operation
High resolution, accuracy, and repeatability on smooth or rough surfaces
AZoNano is grateful for the support provided by our sponsors to both AZoNano.com and to the authors
and peer reviewers of AZoJono -Journal of Nantechnology Online - open access to leading Nanotech Science.
