Solar Metrology,
a global provider of X-Ray Fluorescence (XRF) analysis tools, expands its SMX
XRF tool portfolio for film composition and thickness measurement of CIGS photovoltaic
depositions with the addition of the System SMX-ISI.
Solar Metrology’s System SMX-ISI is an in-situ x-ray fluorescence (XRF)
metrology tool platform that provides composition and thickness measurements
for thin film solar PV metal film stacks on flexible roll to roll substrates
such as stainless steel, aluminum and polyimide or rigid substrates such as
float glass. Typical measurement applications include Mo thickness and all CIGS
combinations (including all CIG alloys and/or film combinations and final CIGS
formulations).
SMX-ISI is fast, flexible and easily integrated into any vacuum deposition
tool or vacuum process station or point of a vacuum process line.
SMX-ISI utilizes X-ray fluorescence, an enabling technology for CIGS manufacture,
that delivers yield management and yield improvement by allowing in-situ process
control. The SMX-ISI tool Platform does not affect your process since all SMX-ISI
tool components reside outside of vacuum for optimum performance and serviceability.
Solar Metrology's SMX Measurement tool platform provides a production-ready
suite of film thickness and composition measurement tools for research and process
development, in-process monitoring and post-process quality control. Solar Metrology
is the global leader in the development and manufacture of high-performance
X-Ray Fluorescence (XRF) analysis tools, specifically engineered to meet the
demanding thin film measurement requirements of the solar electric and renewable
power industries.
Posted September 21st, 2009
