Bruker
announces the official launch of the new N8 NEOS SENTERRA micro-analysis system
that combines the Raman Spectroscopy and Atomic Force Microscopy (AFM) on a
single optical microscope platform.
A comprehensive materials research investigation demands a multi-technique
approach. Bruker Optics’ SENTERRA Raman spectrometer and Bruker Nano’s
N8 NEOS Atomic Force Microscope was combined to allow morphological, structural
and chemical analysis of the same sample area. Calibrated sample positioning
allows simple and precise serial measurements, where the resultant Raman spectra
is easily correlated with the AFM image.
The N8 NEOS SENTERRA combines the flexibility of Raman spectroscopy with intuitive
AFM control. Optimal stability is achieved by mounting the SENTERRA on the ultra-stable
N8 NEOS base. The N8 NEOS SENTERRA provides all the same alignment-free and
intuitive design of the original N8 NEOS AFM. The distinctive interferometric
detection system provides accurate tip deflection values in directly in nanometers
instead of voltages for more precise force control and optical microscope is
the highest quality of any AFM.
The compact SENTERRA Raman system has software selectable lasers and gratings
to facilitate specific excitation wavelengths and spectral resolutions optimized
for each sample. With its patented Sure_Cal® calibration technology, the
SENTERRA is permanently aligned for the wavelength scale with a wavelength stability
of 0.1 cm-1.
The new N8 NEOS SENTERRA is the ideal tool for research applications and multi-user
facilities, where flexibility and ease-of-use are essential prerequisites. High
sample throughput and the best attainable results are guaranteed.
Raman spectroscopy? Atomic Force Microscopy? Two questions, one answer: N8
NEOS SENTERRA.
Posted September 23rd, 2009
