PITTCON 2009 (8-13 March, Chicago, USA) will see the launch of PANalytical's
new standardless analysis package, Omnian. This latest module in the company's
proven SuperQ software suite is designed to be used with the Axios sequential
X-ray fluorescence (XRF) spectrometer.
Omnian provides the ideal answer for characterization and analysis of unknown
samples, or in situations where certified standards that match specific sample
characteristics are not available.
Omnian can handle a wide variety of sample types such as solids, pressed powders,
fused beads, loose powders and liquids. The software is adaptable, depending
on user experience or the desired mode of operation. With its problem-solving
power it deals with analytical challenges including sample quantification, screening
and failure analysis, as well as the comparison of different materials.
Omnian is set to become the new benchmark in these important applications.
It is designed to provide fast, reliable quantification in the default ‘black
box’ mode. However, the data collected is comprehensive and can be reviewed
The system adjusts automatically to sample and matrix effects as well as sample
thickness, volume and ‘Dark–Matrix’ composition. It can be
fine-tuned for increased accuracy by using Adaptive Sample Characterization
Omnian is supported by PANalytical’s worldwide network of support and
service specialists. For more information, visit www.panalytical.com/omnian