Agilent Technologies Inc. (NYSE: A) today announced the addition of several new capabilities to its 5600LS, a high-resolution atomic force microscope (AFM) that uses a fully addressable 200mm x 200mm stage and a low-noise AFM design to image both large and small samples. For ultimate flexibility, the 5600LS can accommodate either a single large sample or multiple small samples, each of whose locations can be programmed into the state-of-the-art AFM system. Outstanding instrument versatility makes the Agilent 5600LS an ideal choice for multi-user facilities.
"The 5600LS is the world's only commercially available AFM that allows imaging of large samples in air as well as small samples either in air or in liquid under temperature control with a high-resolution 9-micron scanner," said Jeff Jones, operations manager for Agilent's AFM facility in Chandler, Ariz. "The 5600LS system's ability to use open- and closed-loop scanners with a 9-micron scan range allows imaging of small feature sets at atomic resolution. This advanced multipurpose AFM enables a remarkably broad set of nanotechnology applications, including semiconductor, materials science and life science studies."
A special Agilent stage adapter permits the 5600LS to be used with a sample plate that facilitates in-fluid imaging of small samples. The AFM offers heating and cooling control for imaging biological and polymer samples in liquid. Agilent's patented MAC Mode gives 5600LS users industry-leading performance for in-fluid and soft-sample imaging.
The 5600LS supports all major AFM modes. Using MAC Mode III provides three user-configurable lock-in amplifiers, affording researchers virtually limitless application possibilities and unprecedented speed. MAC Mode III allows single-pass imaging concurrent with KFM/EFM, facilitates vertical or lateral modulation studies, and supports the use of higher resonance modes of the cantilever.
The 5600LS is also compatible with Agilent's unique scanning microwave microscopy (SMM) mode, which -- for the first time -- combines the compound, calibrated electrical measurement capabilities of a microwave vector network analyzer (VNA) with the nanoscale spatial resolution and high-precision positioning of an atomic force microscope. SMM mode outperforms traditional AFM-based scanning capacitance microscopy techniques, offering far greater application versatility, the ability to acquire quantitative results, and the highest sensitivity and dynamic range in the industry.