More than 150 scientists and users of the ZEISS
CrossBeam® and Helium Ion Microscope systems met at the 1st European user
workshop in Dresden. In several sessions the participants got an overview on
current product developments and new applications.
Following a presentation of the new AURIGA CrossBeam workstation (FIB-SEM)
and its huge application potential, users presented deep insight in their current
research and development work carried out with CrossBeam systems from Carl Zeiss.
Topics ranged from applications in Semiconductor Technology to material analysis,
thin-film based solar cells as well as fabrication of micro- and nanodevices
A most eagerly anticipated session was dedicated to the ORION Helium-Ion microscope.
„The presentations from Conny Rodenberg of University of Sheffield and
Frank Altmann from the Fraunhofer Institute for Mechanics of Materials (Halle)
made clear the unique potential of this exciting technology“, explained
Gerd Maußner, from Areva NP GmbH (Germany), one of the participants of