a leading international supplier of consumables, accessories and specialist
equipment for all areas of microscopy, announces the latest technical data is
now available on Kleindiek's in-situ lift-out (INLO) shuttle.
In-situ lift-out techniques have become more reliable methods for preparation
of samples requiring TEM and atom probe inspection. However, despite their new-found
popularity, they remain considerably more expensive than ex-situ lift-out techniques
and require valuable time on the FIB. These time and cost factors produced the
need for a faster, simpler procedure without reducing the reliability of the
technique. Kleindiek Nanotechnik's answer to this problem is the Lift-out
Shuttle, a simple and efficient tool which offers the benefits of decreased
cost, increased sample throughput, reduced FIB time and reliable results.
The Lift-out Shuttle has a diameter of 50mm and is compatible with the loadlock
systems of most makes of SEM and FIB. When used with Kleindiek's SEM-compatible
glue, the Lift-out Shuttle removes the need for gas precursors and sample contamination,
such as that associated with ion beam induced deposition (IBID) techniques,
Operation is extremely straightforward. The lift-out shuttle contains a microgripper
which is used to first contact and then securely hold the pre-cut sample. This
then allows the sample to be easily freed from the bulk material by simply dropping
the substage. This can all be carried out ex situ with the help of a light microscope.
The whole assembly is then transferred to the vacuum ready SEM or FIB via the
loadlock. The sample can now be attached to a holder (e.g. a TEM grid) using
vacuum compatible adhesive (SEMGLU) which is hardened under the electron beam.
These steps may be repeated for multiple samples without breaking vacuum.
More details including excellent images illustrating Kleindiek's INLO
technique are now available from Agar.
Agar supplies one of the broadest ranges of accessories and consumables for
microscopy. The complete range is available in either electronic or printed-catalogue
form. To receive your copy, please visit www.agarscientific.com
and register today.