Inc. today announced that its Applied SEMVision™ G4 Defect Analysis
platform has been honored with the prestigious Editors' Choice Best Product
Award by Semiconductor International (SI) magazine. The winning combination
of innovative technology and production-proven performance has made the SEMVision
G4 platform the defect review tool of choice for 32nm design rules and beyond.
Innovative technology and production-proven performance have made the Applied SEMVision G4 platform the defect review tool of choice for 32nm design rules and beyond. (Photo: Business Wire)
"The Editors' Choice Best Products awards program acknowledges products,
materials and services that are proven in the manufacturing environment,"
said Laura Peters, Editor-in-Chief of Semiconductor International. “In
the evaluation process, SI's editors consider the products based on feedback
from actual customers in the field and only the most highly recommended ones
are honored each year.”
“This award recognizes the tremendous impact Applied’s SEMVision
technology has had on the semiconductor industry,” said Tom St. Dennis,
senior vice president and general manager of Applied Materials’ Silicon
Systems Group. “The SEMVision G4 system’s exceptional image quality
and advanced material analysis capabilities are powerful tools to help chipmakers
understand and mitigate the root causes of yield-killing defects.”
The Applied Defect Review SEMVision systems are designed for the most advanced
review applications, capable of automatic defect redetection (ADR) and automatic
defect classification (ADC) of critical defects. Key features of the SEMVision
G4 technology are its new scanning electron microscope (SEM) column and enhanced
multi-perspective SEM imaging system that deliver state-of-the-art 2nm physical
resolution for unmatched image quality at a benchmark review rate of one defect-per-second.
The Applied SEMVision system pioneered automatic defect review in 1998, revolutionizing
the way fabs detect and analyze defect information. For the past ten years,
SEMVision technology has provided enabling capability to the industry, with
over 700 systems installed at customer sites worldwide. This is the third SI
award for Applied’s SEMVision technology, beginning with the first SEMVision
system in 2000 and continuing with the SEMVision G2 FIB in 2005.
Applied Materials, Inc. (Nasdaq:AMAT) is the global leader in Nanomanufacturing
Technology™ solutions with a broad portfolio of innovative equipment,
service and software products for the fabrication of semiconductor chips, flat
panel displays, solar photovoltaic cells, flexible electronics and energy efficient
glass. At Applied Materials, we apply Nanomanufacturing Technology to improve
the way people live.