Nova Measuring Instruments
Ltd. (NASDAQ: NVMI) provider of leading edge stand-alone metrology and the
market leader of integrated metrology solutions to the semiconductor process
control market, today announced that NovaMARS advanced Scatterometry modeling
and analysis software has been chosen as one of 15 best products of 2009 by
the editors of Semiconductor International. In the evaluation process, Semiconductor
International's editors consider the products based on feedback from actual
customers in the field, and only the most highly recommended ones are honored.
NovaMARS features advanced capabilities to model complex 3D semiconductor
structures and enables extraction of fine profile details. Recently, the Company
announced MatMaker(TM), an extension of NovaMARS, which is a revolutionary material
characterization package that can reduce time to solution from days to hours,
and improves Optical CD quality.
"We are honored to receive this year's Semiconductor International's
Best Product Award," commented Dr. Boaz Brill, VP Technology at Nova. "As
semiconductor manufacturers increasingly rely on Optical CD to extract fine
profile details that are otherwise undetectable by conventional high volume
manufacturing metrology technologies like CD-SEM, the modeling software becomes
a critical part of the metrology solution. In NovaMARS, we implemented advanced
algorithms that can cope with the complexity of advanced 32nm and 22nm devices
on one hand, while shortening time to solution on the other hand. I see NovaMARS
as a key to further extending the proliferation of our Optical CD metrology
as we continue to innovate and build upon the knowledge and experience we gained
working with leading customers."