(Nasdaq:FEIC), a leading provider of atomic-scale imaging and analysis systems,
today announced the release of the Tecnai Osiris(tm) scanning/transmission electron
microscope (S/TEM), delivering revolutionary analytical speed and performance.
It includes FEI's new ChemiSTEM technology, which reduces the time for large
field-of-view elemental mapping from hours to minutes. The Tecnai Osiris is
designed to combine this breakthrough analytical throughput with exceptional
ease-of-use to meet the requirements for both high-volume industrial and multi-user
The patent-pending ChemiSTEM technology enables the Tecnai Osiris to achieve
a factor of 50 or more enhancement in speed of energy dispersive x-ray (EDX)
elemental mapping, by combining technical advances in beam generation with disruptive
changes in EDX signal detection. The Tecnai Osiris is built on a platform designed
to maximize productivity and return on investment in high-volume analysis.
Tony Edwards, FEI's senior vice president of market divisions, adds, "The
Tecnai Osiris addresses the needs of both our research and industrial customers
who place increasing importance on elemental composition analysis and mapping
of all samples, but until now, could not find an S/TEM with the required analytical
speed and ease-of-use to support this requirement. For example, the continuing
decrease in device sizes and proliferation of new materials in semiconductor
manufacturing, and the appearance of more samples with unknown composition in
multi-user research facilities drives the need for an S/TEM providing the ease-of-use
of EDX analytics with an elemental mapping speed comparable to STEM imaging."
Edwards adds, "The Tecnai Osiris was designed to fill this current gap
in the market by providing elemental mapping with large fields-of-view in minutes
instead of hours, and without the need for an operator highly trained in complex
analytics. This ease-of-use is further extended by the new SmartCam remote control
interface, which enables experts to provide remote guidance in multi-user or
industrial facilities to less experienced operators."
The Tecnai line has a long history of performance and reliability as a workhorse
tool in industrial applications. The Tecnai Osiris, a 200 kiloVolt (kV) S/TEM,
continues the Tecnai tradition with the addition of numerous technical innovations,
including: ChemiSTEM, which comprises the proprietary X-FEG high brightness
electron source and Super-X, FEI's new EDX detection system based on Silicon
Drift Detector (SDD) technology; MultiLoader(tm) sample handling that reduces
thermal equilibration time after sample exchanges by ten times with commensurate
improvements in time-to-data; and the new FS-1 electron energy loss spectrometer
that improves electron energy loss spectrometry (EELS) speed and sensitivity;
as well as other enhancements, such as the SmartCam remote control camera, long-life
liquid nitrogen supply, and more.
"When revolutionary analytical speed, throughput and ease-of-use in a
reliable, all-purpose S/TEM are critical, the Tecnai Osiris is the ideal solution,"
The Tecnai Osiris S/TEM is available for ordering immediately. For more information,
please visit: www.fei.com.