FEI Company
(Nasdaq:FEIC), a leading provider of atomic-scale imaging and analysis systems,
today announced the release of the Titan(tm) G2 scanning/transmission electron
microscope (S/TEM) Family, inaugurating the second generation of the company's
revolutionary Titan platform -- the world's most powerful commercially-available
microscope. The Titan G2 incorporates a number of innovative technology modules
in order to deliver resolutions down to 70pm (0.7 Angstrom) in both STEM and
TEM, thus offering the ultimate in aberration-corrected S/TEM performance.
Dominique Hubert, FEI's vice president and general manager of the Research
Market Division, adds, "The TEM market was afforded routine sub-Angstrom
resolution with the Titan platform in 2005. It has enabled researchers to see
details never seen before with numerous leading scientific papers to testify
its success in materials research. The next-generation Titan G2 Family has now
arrived, and it further expands the limits of performance while maintaining
the Titan philosophy to put materials science first. For our customers, this
means combining deep sub-Angstrom resolution with the ability to collect the
most materials information on the broadest range of samples."
Hubert adds, "Flexibility is key in materials research and analysis. With
Titan G2, users can choose the performance, application and information optimized
for their material. We have further extended the minimum accelerating voltage
down to 60 kiloVolt (kV), in response to intense research interest in low voltage
microscopy results obtained on the first generation Titan family. The broadest
available high tension range of 60-300 kV offered by the Titan G2 will allow
our customers to make the best choice for each sample."
The Titan G2 60-300 Family offers the choice of second-generation spherical-aberration
(Cs) probe and Cs image correction, and in the base configuration, it delivers
80pm specified resolution in both TEM and STEM operation. With the addition
of novel FEI proprietary technology modules, such as a high brightness electron
source, a monochromator and an environmentally-isolated microscope enclosure
(Titan3(tm) G2 60-300), specified resolution improves to 70pm in either STEM
or TEM modes. This configuration delivers the ultimate commercial S/TEM performance,
setting records in spatial resolution, energy resolution for analytics and high
tension range. Further, the environmentally-isolated configuration is equipped
with a unique, fully-remote operation capability, ideal for maintaining the
microscope under stable conditions, and can also be used for sharing the results
in real-time across a collaborative team that is spread across a number of locations.
"The Titan G2 can truly deliver a new generation of results in microscopy,"
said Mike Scheinfein, FEI's chief technology officer. "Perhaps the most
exciting aspect of the G2's ultimate performance is not its sub-Angstrom resolution
capability, but the fact that it delivers unprecedented sensitivity and precision
at the sub-atomic level as well. Our customers and partners helping us to test
these advanced technologies have already shown that they are enabling breakthrough
microscopy results, such as single atom detection across a broad range of the
periodic table, and quantitative microscopy with experimental precision at the
5pm level."