JEOL Releases New Publications Explain Theory and Operation of SEM for Routine Imaging and Elemental Analysis

Published on August 11, 2009 at 11:40 PM

JEOL, a leading supplier of high resolution, high performance Scanning Electron Microscopes (SEM) and atomic resolution Transmission Electron Microscopes (TEM), has developed two new publications that explain theory and operation of the SEM for routine imaging and elemental analysis.

These two new books can be downloaded from the JEOL USA website ( under the Resources tab, or by clicking on and They are a useful resource for novice users of SEM or anyone teaching basic SEM operation.

"SEM: Scanning Electron Microscope A to Z - Basic Knowledge for Using the SEM," explains basic principals of operation, image display, the role of secondary and backscattered electron detectors, and the vacuum system. Further explanation of the SEM includes edge effect, the influence of accelerating voltage, the illumination effect of secondary and backscatter electron detectors, techniques for improving image resolution, benefits of different types of electron guns, elemental analysis, and sample preparation.

"SEM Q&A," answers specific questions most often asked during demonstrations and training: how to mount powder samples, selecting the accelerating voltage, stereoscopic observation techniques, and more.

These documents replace two popular, long-standing JEOL books, "A Guide to Scanning" and "Introduction to the SEM World."

Tell Us What You Think

Do you have a review, update or anything you would like to add to this news story?

Leave your feedback