Company (Nasdaq:FEIC), a leading provider of high-resolution imaging and
analysis systems, today announced the release of two dedicated scanning electron
microscopes (SEMs) and a new software package for automated analysis of gunshot
residues (GSR). Forensic scientists use GSR analysis to match residues from
victims and suspects. The new GSR S50 and GSR F50 SEMs include the newly-released
Magnum(tm) GSR software and specially-modified hardware to provide fully-automated
analysis with dramatic improvements in speed, accuracy and affordability.
"These new systems are specifically designed to address the needs of forensic
laboratories for fast, reliable analysis," said Paul Scagnetti, vice president
and general manager of FEI's Industry Division. "GSR analysis can be a
long and tedious process, yet the results are often used to make life and death
decisions. The S50 and F50 completely automate the analysis procedure reducing
opportunity for operator error. The systems include dedicated validation routines
for accurate results. In addition, optimal use of the SEM's imaging capabilities
and features, such as the beam current booster, give faster, more repeatable
GSR analysis uses high-resolution SEM imaging to locate residue particles,
and X-ray spectrometry to determine their elemental composition. The GSR S50's
ability to image uncoated samples in low vacuum mode helps preserve sample integrity.
The GSR F50's field emission source delivers higher spatial resolution and puts
more beam current into a smaller spot for faster, more precise X-ray analysis.
The new Magnum GSR software, included in both systems, uses the SEM's native
imaging capabilities to locate particles, which is a much faster method than
the conventional approach that uses the X-ray system to control the particle
imaging and detection process. A specially-designed beam current booster (BCB)
increases beam current during X-ray data acquisition to improve the speed and
precision of the analysis. To help optimize price/performance, both systems
are fully compatible with the latest high count rate silicon drift X-ray detectors
from Bruker Corporation and EDAX. They also include built-in validation procedures
that use the latest standard layouts of the ENFSI proficiency tests.