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Posted in | Nanoanalysis | Nanobusiness

Rapid, Three-Dimensional Surface Characterization for Large Samples

Published on September 21, 2009 at 8:17 AM

Veeco Instruments Inc. (Nasdaq: VECO), a leader in scientific and industrial metrology, today announced the release of its NPFLEX™ 3D Metrology System for characterizing surfaces previously too difficult to measure due to size or part orientation. The NPFLEX combines the industry-leading performance of Veeco's non-contact, white light optical profilers with a unique open-access design to enable rapid, three-dimensional data acquisition and analysis on a wide range of large samples for precision machining applications in the medical implant, aerospace, and automotive market sectors.

“Veeco has responded to an unfulfilled need for rapid surface texture measurements of large precision machined parts,” said Mark R. Munch, Ph.D., Executive Vice President, Veeco Metrology. “The NPFLEX is capable of performing the critical measurements necessary to guide manufacturers' decision-making processes throughout the entire production cycle, from R&D through failure analysis.”

Andrew Masters, Veeco's Vice President of Segment Marketing and Business Development, added, “The large sample capability of the NPFLEX provides precision machining manufacturers the ability to conduct true non-contact, non-destructive analysis of larger form factors with tight tolerances. Customers now have at their disposal the extensive surface characterization abilities necessary to refine their processes and products in the real world manufacturing environment.”

The NPFLEX utilizes a break-through gantry design to provide over 300 degrees of access for large samples. The unique option of a swiveling optical head permits routine investigation of highly curved samples and beveled edges. The system's white light interferometric technology provides greater accuracy, repeatability and, more importantly, data density than is possible with contact instrumentation. Other standard features include long working distance objectives, a proprietary objective crash-mitigation system, automation and field-stitching software, and patent-pending, ultra-uniform dual-LED illumination. Running on the industry-leading Vision® software platform, the NPFLEX provides access to over 200 distinct analyses, and over 1000 critical parameters for measuring curvature, lay, bearing ratio, wear, corrosion, and other critical parameters.

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