The London Centre for
Nanotechnology (LCN) and Veeco Instruments, UK are joining forces to set-up
a training course for professionals and academics dedicated to the utilisation
of Atomic Force Microscopes (AFM). This training course is to be sanctioned
by a professional certification controlled and maintained by the LCN. Both the
LCN and Veeco Instruments are at the forefront of nanotechnology and together
represent the ideal partnership to develop this certification.
The London Centre for Nanotechnology is a UK-based, multidisciplinary research
centre forming the bridge between the physical and biomedical sciences. It was
conceived from the outset with a management structure allowing for a clear focus
on scientific excellence, exploitation and commercialisation. It brings together
two world leaders in nanotechnology, namely University College London and Imperial
College London, in a unique operating model that accesses the combined skills
of multiple departments, including medicine, chemistry, physics, electrical
and electronic engineering, biochemical engineering, materials and earth sciences,
and two leading technology transfer offices.
Veeco is a leading provider of Metrology and Process Equipment solutions used
by manufacturers in the High-Brightness LED, solar, data storage, semiconductor,
scientific research and industrial markets. These industries help create a wide
range of information age technology and products, such as portable music players,
cell phones, PDAs, digital video recorders, backlighting for computers and TVs,
architectural and automotive lighting, solar cells and much more. In our Metrology
segment, we design and manufacture atomic force microscopes (‘‘AFMs’’),
stylus profilers, and optical interferometers used to provide critical surface
measurements in research and production environments. Our broad line of AFMs,
scanning probe microscopes (‘‘SPMs’’), optical interferometers,
and stylus profilers are used in universities, research facilities and scientific
centres worldwide. In production environments such as semiconductor, data storage
and other industries, our metrology instruments enable customers to monitor
their products throughout the manufacturing process to improve yields, reduce
costs, and improve product quality.
“There is a plethora of training available on AFM,” says Dr Thierry
Bontoux (LCN’s deputy director in charge of Business development). “However,
there is no way to bench mark the value of each individual professional working
on this kind of instrument. What the industry and the academics need is a realistic
tool to evaluate the competences of different users. This is the aim of the
training and the certification launched by the LCN and Veeco.”
The LCN has developed this training course in close collaboration with the
engineers of Veeco. The list of certified users will be displayed and maintained
on the LCN web site since this certification will only be valid for three years
to guarantee the practical competences of certified staff.
“It All engineers require strong and reliable training but in addition
they need to maintain their skill levels throughout their careers,” explains
Robert Frankum (Veeco’s UK sales manager). “This kind of training
did not exist and it appeared to us that if it had to be done, Veeco and the
LCN had to do it, being at the forefront of nanotechnology.”
This certification will be officially announced during the SPM meeting in
Warwick on the 28-29 of September, and the first course will be given at the
LCN on the 16 and 17 of November 2009.