JEOL, a global leader
in the development and manufacture of scanning and transmission electron microscopes,
introduces ClairScopetm, a first-of-its kind correlative microscopy tool that
combines a high-end Light Microscope (LM) with a high-resolution Atmospheric
Scanning Electron Microscope (ASEM).
New JEOL ClairScope ™ Correlative Microscope
The new JEOL ClairScope enables uncompromised observation of samples in their
native state using both LM and ASEM, significantly reducing sample preparation
time and allowing dynamic observation of real time processes. The atmospheric
SEM allows high resolution observation of wet biological samples such as cultured
cells and imaging of materials samples in liquids.
High Resolution Observation of Life Science and Materials Experiments
As They Occur
The ClairScope's unique specimen dish makes it possible to add reagents, drugs,
and other substances to the sample in order to perform experiments and observe
reactions in both liquid and gas environments. For the first time, life science
researchers can harness the powerful imaging capability of the SEM to observe
biological processes such as platelet generation, distribution of sugar chains,
and microbe growth. Materials scientists will be able to observe and record
crystallization, electrochemical reactions, emulsion technology, self-assemblies,
and dendrite growth as they occur.
Integrating LM and SEM with Control of Sample Environment
Researchers can control the specimen's environment and stop processes at specific
points in the experiment using the ClairScope to observe samples at atmospheric
pressure in liquid or gas. The wide-field light microscope with emersion lens
is co-axially aligned with the inverted electron column making it easy to switch
between the light microscope and the electron microscope without repositioning
the specimen dish. The specimen dish features an ultrathin SiN film window that
allows transmission of the electron beam for SEM imaging while the sample is
open to atmospheric pressure.
"The ClairScope features a high quality wide-field microscope integrated
with the ASEM. When we combine SEM and LM, there is no compromise in working
distance and there are no issues with vacuum in the ClairScope," said Mitsuo
Suga, ClairScope Project Leader.
Atmospheric SEM vs. Environmental SEM
The development of an Atmospheric SEM offers greater opportunities to observe
samples in their native state than previously possible. "The advantage
of this ASEM over an ESEM is that we can look at samples at room temperature
and at atmosphere and we can watch those processes dynamically," said JEOL
USA Product Manager Donna Guarrera. "No lengthy drying processes, protective
coating, or freezing of wet samples such as cultured cells, is required."
The new ClairScope is being introduced at the Society for Neuroscience meeting
in Chicago this week, where more than 30,000 scientists are involved in cutting
JEOL is a world leader in electron optical equipment and instrumentation for
high-end scientific and industrial research and development. Core product groups
include electron microscopes (SEMs and TEMs), instruments for the semiconductor
industry (electron beam lithography and a series of defect review and inspection
tools), and analytical instruments including mass spectrometers, NMRs and ESRs.
JEOL USA, Inc., is a wholly owned subsidiary of JEOL, Ltd., Japan, and was
incorporated in the United States in 1962. The company has 13 regional service
centers that offer unlimited emergency service and support in the U.S.