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CRAIC Technologies Introduces QDI 2010 PV Microspectrophotometer

Published on October 31, 2009 at 6:25 PM

CRAIC Technologies, the leading manufacturer of UV-visible-NIR microscopes and microspectrometers, is pleased to announce the QDI 2010 PV microspectrophotometer. The QDI 2010 PV instrument is designed to measure the transmission and reflectance of photovoltaic cells whether they be the traditional crystalline silicon, one of the thin film variety or such components as super- and substrates. Even protective glass and concentrator modules can be analyzed. The QDI 2010 PV also enables the user to determine thin film thickness of microscopic sampling areas on both transparent and opaque substrates. This powerful tool also has a host of other functions. It can be combined with CRAIC Technologies proprietary contamination imaging capabilities to locate and identify process contaminants. As such, the QDI 2010 PV represents a major step forward in metrology instrumentation available to the photovoltaic industry.

"Many of our customers want to test the quality of photovoltaic devices for rapid quality control of their products. The QDI 2010 PV microspectrophotometer was built in response to customer requests for a powerful, flexible metrology tool that can test a number of different aspects of many different photovoltaic devices" says Dr. Paul Martin, President.

The complete QDI 2010 PV solution combines advanced microspectroscopy with sophisticated software to enable the user to measure transmissivity, reflectivity, and luminescence. It will also be able to determine the thin film thickness by either transmission or reflectance of many types of materials and substrates. It can also be used to measure the transmissivity and reflectivity from many of the components used to manufacture PV cells such as concentrators. Due to the flexibility of the CRAIC Technologies design, sampling areas can range from over 100 microns across to less than a micron. Designed for the production environment, it incorporates a number of easily modified metrology recipes, the ability to measure new films and materials as well as sophisticated tools for analyzing data. Other features such as contamination analysis are easily added to this instrument.

For more information about QDI 2010 PV microspectrophotometer and its applications, visit www.microspectra.com.

CRAIC Technologies, Inc. is a global technology leader focused microimaging and microspectroscopy in the ultraviolet, visible and near-infrared regions. CRAIC Technologies creates innovative solutions, with the very best in customer support, by listening to our customers and implementing solutions that integrate operational excellence and technology expertise. CRAIC Technologies provides solutions for customers in forensic sciences, health sciences, semiconductor, geology, nanotechnology and materials science markets whose applications demand accuracy, precision, speed and the best in customer support.

Posted on October 31st, 2009

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