Agilent Technologies Inc.
(NYSE:A) today announced that the first Nano
Measure Scientific Symposium (Nano Measure 2010) will take place June 3-4
at Jagiellonian University in Krakow, Poland. The two-day event will feature
some of the most prestigious scientists presenting leading-edge, nanomeasurement-driven
The Nano Measure 2010 agenda comprises four applications-focused sessions:
In Situ Life Science Studies, Biomaterials & Single-Molecule Characterization
at the Nanoscale; Polymers -- Nanomorphology, Controlled Fabrication & Property
Characterization; Nanomechanical Properties of Organic & Inorganic Materials;
and Materials at the Nanoscale -- Imaging, Electrochemistry & Electrical
"Nano Measure 2010 provides an excellent opportunity for researchers across
a variety of disciplines to meet and discuss their work in a friendly, professional
setting," said Jeff Jones, operations manager for Agilent's nanoinstrumentation
facility in Chandler, Ariz.
Users of atomic force microscopes, nanomechanical test instrumentation, and
all complementary nanomeasurement techniques and technologies are encouraged
to submit original paper and poster abstracts. Each of the sessions will include
guest speaker presentations and up to 10 oral papers selected from the submitted
abstracts. The program will be augmented by a comprehensive poster session.
The Nano Measure 2010 symposium's keynote speaker is Emeritus Prof. Trevor
Page (FREng) of the School of Chemical Engineering and Advanced Materials, Newcastle
University, England. A former Head of Materials Engineering and Metallurgy at
Newcastle, Dr. Page also was the University Pro-Vice-Chancellor for Research
and External Affairs from 2000 to 2008 and currently holds the Cookson Group
Chair of Materials Engineering.
Nano Measure 2010 session chairs are Prof., Dr. Peter Hinterdorfer, University
of Linz, Austria; Dr. Sergei Magonov, Agilent Technologies; Drs. Warren Oliver
and George Pharr, University of Tennessee-Knoxville, United States; and Prof.
Dr. Marek Szymonski, Jagiellonian University.
Additional information regarding registration for Nano Measure 2010, the submission
of paper and poster abstracts, and symposium guest speakers is available at