Paul Dodd, a Sandia National
Laboratories researcher, has been named a Fellow of the Institute of Electrical
and Electronics Engineers (IEEE) "for contributions to the understanding and
simulation of single-event effects in microelectronic," according to a notification
sent out by the organization.
Sandia researcher and IEEE Fellow Paul Dodd
Single-event effects in microelectronics are caused when energetic particles
in a radiation environment (typically protons, neutrons, or heavy ions) strike
a sensitive region of a microelectronics device or integrated circuit. The particle
strike may cause no observable effect, a temporary malfunction, or even permanent
damage
The IEEE Grade of Fellow - one of the institute's most prestigious
awards - is conferred by the board of directors upon a person with an
extraordinary record of accomplishments in any of the IEEE fields of interest.
The total number of fellows selected in any one year cannot exceed one-tenth
of one percent of IEEE's total voting Institute membership.
Dodd serves as team leader for Radiation Physics, Technology, and Assurance
at Sandia. He received his B.S., M.S., and Ph.D. degrees in electrical engineering
from Purdue University in 1988, 1989, and 1993, respectively, and joined Sandia
following the completion of his graduate studies. During the past 16 years,
he has been involved in the development of Sandia's radiation-hardened
bulk and silicon-on-insulator CMOS technologies, the investigation of physical
mechanisms responsible for device radiation response, and the computer simulation
of radiation effects on microelectronics. During this time he has also performed
extensive radiation hardness assurance testing of a variety of microelectronics
devices and integrated circuits, with an emphasis on the testing and analysis
of single-event effects. His work has led to an improved understanding of physical
mechanisms for single-event effects and has been critical to the success of
several space and military systems that must operate reliably in radiation environments.
Dodd is active in the radiation effects and microelectronics research communities.
He served on committees for the IEEE Nuclear and Space Radiation Effects Conference
(NSREC), the IEEE International Electron Devices Meeting, and the IEEE International
Reliability Physics Symposium (IRPS). Dodd has been general chairman, technical
program chairman, short course chairman, awards chairman, and publicity chairman
for the IEEE NSREC. He has presented numerous short courses at the NSREC, the
IRPS, the IEEE Silicon-on-Insulator Conference, the Hardened Electronics and
Radiation Technology Conference, and the European RADECS conference.
Dodd has authored or co-authored over 100 publications, including papers that
have won nine outstanding conference paper awards at the IEEE NSREC. In 2001,
Dodd received an IEEE Early Achievement Award and was named Outstanding Young
Engineer by the IEEE's Albuquerque Section.
Posted February 24th, 2010