At Analytica 2010, Bruker AXS today launches its significantly enhanced S2 RANGER™ energy dispersive X-ray fluorescence (EDXRF) spectrometer with the new, maintenance-free 4th-generation XFlash® LE silicon drift detector (SDD). The combination of the XFlash LE SDD with 50 W excitation power eliminates conventional limitations of benchtop EDXRF systems for light elements, such as sodium and magnesium.
S2 RANGERTM energy-dispersive X-ray fluorescence spectrometer with XFlash® LE detector and 28 position XY-autosampler.
This increase in performance extends the applications range of the S2 RANGER further into the food, minerals and mining, and cement industries. The S2 RANGER is now in full compliance with international standards such as ISO 29581 and EN 196-2 for cement, delivering results with better precision in shorter measurement times compared to conventional EDXRF and low-power wavelength-dispersive X-ray fluorescence (WDXRF) systems. The CEMENT-QUANT turn-key software solution for the S2 RANGER with XFlash LE SDD is offering powerful performance for cement and raw materials quantification.
The rugged and compact all-in-one design with built-in vacuum pump makes the new S2 RANGER an ideal system for industrial process and quality control. It is now even suitable as a backup analyzer for large, high-power WDXRF systems.
The popular, proven features of the S2 RANGER include true multi-element analysis using the standardless method EQUA ALL™ for material identification and element quantification. Also included is a touch-screen interface for simple operation, now in several languages including English, Spanish, Chinese, Russian and Portuguese.
Dr. Kai Behrens, XRF Product Manager of Bruker AXS, stated: “The new S2 RANGER with XFlash LE is pushing the limits of EDXRF to a higher level. Convincing elemental quantifications in products as diverse as milk powder, feldspar, limestone and cement materials are the perfect proof of the new S2 RANGER’s superior light element performance. Indeed, the S2 RANGER has become a very attractive and powerful alternative to all low-power wavelength-dispersive XRF systems in the market for fast and precise element quantification.”