Scientific has extended the spectral range of the Auto SE in the Near Infra
Red, with the instrument now covering the wavelength range from 440 to 1000
nm. The enhanced performance makes it ideal for automatic characterization of
photovoltaic, semiconductor, flat panel display and optoelectronic thin film
The Auto SE provides simple push button operation allowing sample analysis
in just a few seconds. A complete report is generated automatically, and this
includes film thicknesses, refractive index or optical constants, surface roughness,
The Auto SE is a highly featured instrument that includes an automatic XYZ
stage, real-time imaging of the measurement site with MyAutoView vision system
and integrated microspot optics. The combination of these last two features
is ideal for accurate thin film metrology and for the characterization of nanostructured
and patterned samples. Many accessories are available to suit a large range
of applications from biotechnology to photovoltaic.
The Auto SE includes built-in diagnostic indicators for the automatic detection
and diagnosis of problems, with comprehensive operator guidance for troubleshooting.
With two awards won in 2008, the Auto SE is a turnkey instrument ideal for
routine thin film measurement and device quality control.